Lamia Alam
at Univ of Texas at Dallas
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 7 June 2024 Presentation + Paper
Proceedings Volume 13034, 1303408 (2024) https://doi.org/10.1117/12.3013317
KEYWORDS: Semiconducting wafers, Data modeling, Manufacturing, Image quality

Proceedings Article | 13 June 2023 Presentation + Paper
Proceedings Volume 12528, 1252809 (2023) https://doi.org/10.1117/12.2663364
KEYWORDS: Semiconducting wafers, Deep learning, Silicon, Optical inspection, Defect detection, Manufacturing

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