Speckle patterns have proven to be a versatile tool in various areas of metrology. Different levels of resolution have been achieved depending on how the speckles are produced and the analysis method that is employed.
We show three particular applications of speckle metrology: measurement of refractive index variation (10^-10 uncertainty), wavelength variations (10^-18 m uncertainty), and displacement (10^-11 m uncertainty), where the uncertainties are made very low by an appropriate choice of scattering geometry and analysis method. We explore this both analytically and experimentally. We also discuss the multiplexing capability of speckle patterns, and demonstrate this capability for the simultaneous measurement of polarisation and wavelength variation of multiple light sources.
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