Dr. Lei Huang
at Brookhaven National Lab
SPIE Involvement:
Author
Publications (23)

Proceedings Article | 15 November 2019 Presentation + Paper
Proc. SPIE. 11175, Optifab 2019
KEYWORDS: Metrology, Fourier transforms, Ion beams, Deconvolution, Convolution, Synchrotrons, Ion beam finishing

Proceedings Article | 9 September 2019 Presentation
Proc. SPIE. 11109, Advances in Metrology for X-Ray and EUV Optics VIII
KEYWORDS: Mirrors, Polishing, Metrology, X-rays, Inspection, Interferometry, Synchrotrons, Synchrotron radiation, Free electron lasers, Stitching interferometry

Proceedings Article | 9 September 2019 Presentation + Paper
Proc. SPIE. 11109, Advances in Metrology for X-Ray and EUV Optics VIII
KEYWORDS: Diffraction, Monochromatic aberrations, Mirrors, Sensors, Crystals, X-rays, Wavefront sensors, Wavefronts, Adaptive optics, Optical alignment, Hard x-rays

Proceedings Article | 9 September 2019 Presentation + Paper
Proc. SPIE. 11109, Advances in Metrology for X-Ray and EUV Optics VIII
KEYWORDS: Mirrors, Metrology, Calibration, Error analysis, Ion beams, Deconvolution, Synchrotrons, Ion beam finishing

Proceedings Article | 9 September 2019 Paper
Proc. SPIE. 11112, X-Ray Nanoimaging: Instruments and Methods IV
KEYWORDS: Microelectromechanical systems, X-ray optics, Imaging systems, Microscopy, X-rays, X-ray microscopy, Spatial resolution

Showing 5 of 23 publications
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top