Dr. Lei Lu
at Henan Univ of Technology
SPIE Involvement:
Author
Publications (9)

SPIE Journal Paper | 25 March 2020
OE Vol. 59 Issue 03
KEYWORDS: Digital image correlation, Speckle pattern, Image quality, Optical engineering, Digital imaging, Feature selection, Image analysis, Image processing, Optical testing, Image registration

Proceedings Article | 16 October 2019 Paper
Proc. SPIE. 11205, Seventh International Conference on Optical and Photonic Engineering (icOPEN 2019)
KEYWORDS: Signal to noise ratio, Superposition, Fringe analysis, Principal component analysis, Speckle, Error analysis, Composites, Speckle pattern, 3D metrology, Shape analysis

Proceedings Article | 16 October 2019 Paper
Proc. SPIE. 11205, Seventh International Conference on Optical and Photonic Engineering (icOPEN 2019)
KEYWORDS: Signal to noise ratio, Fringe analysis, 3D acquisition, Cameras, Fourier transforms, 3D modeling, 3D metrology, Motion measurement

Proceedings Article | 2 November 2018 Paper
Proc. SPIE. 10819, Optical Metrology and Inspection for Industrial Applications V
KEYWORDS: Fringe analysis, Phase shifting, Phase measurement

Proceedings Article | 24 July 2018 Paper
Proc. SPIE. 10827, Sixth International Conference on Optical and Photonic Engineering (icOPEN 2018)
KEYWORDS: Fringe analysis, Phase shifting, Projection systems, Reconstruction algorithms, Motion models

Showing 5 of 9 publications
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