Prof. Lei Tao
at Chongqing Institute of Metrology and Quality Inspection
SPIE Involvement:
Author
Publications (7)

Proceedings Article | 12 March 2021 Paper
Proc. SPIE. 11763, Seventh Symposium on Novel Photoelectronic Detection Technology and Applications

Proceedings Article | 12 March 2021 Paper
Proc. SPIE. 11763, Seventh Symposium on Novel Photoelectronic Detection Technology and Applications

Proceedings Article | 18 December 2019 Paper
Proc. SPIE. 11338, AOPC 2019: Optical Sensing and Imaging Technology
KEYWORDS: Particles, Water, Dynamic light scattering, Light scattering, Scattering, Inspection, Bridges, Infrared imaging, Infrared lasers, Infrared radiation

Proceedings Article | 9 November 2018 Paper
Proc. SPIE. 10819, Optical Metrology and Inspection for Industrial Applications V
KEYWORDS: Standards development, Sensors, Imaging systems, Laser scanners, Manufacturing, Metrology, Inspection, Dimensional metrology, Composites, Image registration

Proceedings Article | 23 October 2018 Paper
Proc. SPIE. 10821, Advanced Sensor Systems and Applications VIII
KEYWORDS: Laser scanners, Calibration, Inspection, 3D scanning, Sensors, Metrology, 3D metrology, Curium, Manufacturing, Scanners

Showing 5 of 7 publications
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