Dr. Leonard Forbes
at L Forbes and Associates
SPIE Involvement:
Author
Publications (6)

Proceedings Article | 21 August 2009 Paper
Proc. SPIE. 7402, Nanoengineering: Fabrication, Properties, Optics, and Devices VI
KEYWORDS: Oxides, Chemical species, Interfaces, Silicon, Interference (communication), 3D modeling, Signal processing, Field effect transistors, Molybdenum, Instrument modeling

Proceedings Article | 9 September 2008 Paper
Proc. SPIE. 7042, Instrumentation, Metrology, and Standards for Nanomanufacturing II
KEYWORDS: Capacitors, Calibration, Tungsten, Fourier transforms, 3D modeling, Capacitance, Integrated circuits, Capacitive coupling, Device simulation, Advanced distributed simulations

Proceedings Article | 23 May 2005 Paper
Proc. SPIE. 5844, Noise in Devices and Circuits III
KEYWORDS: Switches, Clocks, Imaging systems, Computer simulations, Thermal effects, Transistors, Cadmium sulfide, Thermal modeling, Device simulation, Low light imagers

Proceedings Article | 23 May 2005 Paper
Proc. SPIE. 5844, Noise in Devices and Circuits III
KEYWORDS: Spectrum analysis, Switching, Modulation, Interference (communication), Amplifiers, Phase shift keying, Transistors, Field effect transistors, Analog electronics, Device simulation

Proceedings Article | 12 May 2003 Paper
Proc. SPIE. 5113, Noise in Devices and Circuits
KEYWORDS: Modulation, Chemical species, Electrons, Diffusion, Resistance, Field effect transistors, Resistors, Heat flux, Chemical elements, Lawrencium

Showing 5 of 6 publications
Conference Committee Involvement (3)
Noise in Devices and Circuits III
24 May 2005 | Austin, Texas, United States
Noise in Devices and Circuits II
26 May 2004 | Maspalomas, Gran Canaria Island, Spain
Noise in Devices and Circuits
2 June 2003 | Santa Fe, New Mexico, United States
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top