Longfei Zhang
at Shenzhen Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 17 May 2019 Paper
Proceedings Volume 11170, 111700Y (2019) https://doi.org/10.1117/12.2532667
KEYWORDS: Silicon carbide, Nanowires, Photodetectors, Semiconductors, Ultraviolet radiation, Scanning electron microscopy, Sensors, Refractive index, Deep ultraviolet, Absorption

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