Louis-Séverin Bieri
at École Polytechnique Fédérale de Lausanne
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 10 September 2004 Paper
Louis-Severin Bieri, Jacques Jacot
Proceedings Volume 5457, (2004) https://doi.org/10.1117/12.545039
KEYWORDS: Cameras, Error analysis, 3D metrology, 3D vision, Calibration, Projection systems, Control systems, LCDs, Picosecond phenomena, Structured light

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