Dr. Lukas Helfen Profile

Dr. Lukas Helfen

at Karlsruher Institut für Technologie

SPIE Involvement:

Author

Publications (7)

Proceedings Article | 5 September 2014 Paper

X-ray laminography and SAXS on beryllium grades and lenses and wavefront propagation through imperfect compound refractive lenses

Thomas Roth, Lukas Helfen, Jörg Hallmann, Liubov Samoylova, Paweł Kwaśniewski, Bruno Lengeler, Anders Madsen

Proceedings Volume 9207, 920702 (2014) https://doi.org/10.1117/12.2061127

KEYWORDS: Beryllium, X-rays, Wavefronts, Wave propagation, Lenses, Optical simulations, X-ray imaging, Beam propagation method, Scattering, Plasma

Read Abstract +

Proceedings Article | 16 September 2008 Paper

The high-resolution synchrotron-based imaging stations at the BAMline (BESSY) and TopoTomo (ANKA)

Alexander Rack, Heinrich Riesemeier, Simon Zabler, Timm Weitkamp, Bernd Müller, Gerd Weidemann, Peter Modregger, John Banhart, Lukas Helfen, Andreas Danilewsky, Hans Gräber, Richard Heldele, Boaz Mayzel, Jürgen Goebbels, Tilo Baumbach

Proceedings Volume 7078, 70780X (2008) https://doi.org/10.1117/12.793721

KEYWORDS: Crystals, X-rays, Sensors, Scintillators, Image resolution, Monochromators, Synchrotrons, Spatial resolution, Light sources, Cameras

Read Abstract +

Proceedings Article | 11 September 2006 Paper

High-resolution three-dimensional imaging by synchrotron-radiation computed laminography

L. Helfen, T. Baumbach, P. Pernot, P. Mikulík, M. DiMichiel, J. Baruchel

Proceedings Volume 6318, 63180N (2006) https://doi.org/10.1117/12.680797

KEYWORDS: 3D image processing, X-rays, Synchrotron radiation, X-ray computed tomography, Sensors, Spatial resolution, Nondestructive evaluation, X-ray imaging, Synchrotrons, Modulation transfer functions

Read Abstract +

Proceedings Article | 21 July 2004 Open Access

Micro- and nano-NDE in the laboratory for acoustic diagnosis and quality assurance

Bernd Koehler, Juergen Schreiber, Beatrice Bendjus, Martin Herms, Valeri Melov, Lukas Helfen, Petr Mikulik, Tilo Baumbach

Proceedings Volume 5392, (2004) https://doi.org/10.1117/12.541652

KEYWORDS: Scanning electron microscopy, Acoustics, X-rays, Nondestructive evaluation, Mirrors, Semiconducting wafers, Microscopy, X-ray diffraction, Silicon, X-ray imaging

Read Abstract +

DOWNLOAD PAPER

Proceedings Article | 23 December 2003 Paper

Determination of lattice plane curvature and dislocation Burgers vector density in crystals by rocking curve imaging technique

Claudio Ferrari, Nicola Verdi, Daniel Luebbert, Dusan Korytar, Petr Mikulik, Tilo Baumbach, Lukas Helfen, Petra Pernot

Proceedings Volume 5195, (2003) https://doi.org/10.1117/12.507495

KEYWORDS: Crystals, Semiconducting wafers, Gallium arsenide, Sensors, Spatial resolution, X-rays, Scattering, Diffraction, Monochromators, Laser crystals

Read Abstract +

Proceedings Article | 22 July 2003 Paper

Investigation of the foaming process of metals by synchrotron radiation imaging

Lukas Helfen, Heiko Stanzick, Joachim Ohser, Katja Schladitz, Petra Rejmankova-Pernot, John Banhart, Tilo Baumbach

Proceedings Volume 5045, (2003) https://doi.org/10.1117/12.484282

KEYWORDS: Foam, Metals, Particles, Radiography, 3D image processing, Aluminum, Solids, Zinc, X-rays, Image processing

Read Abstract +

Proceedings Article | 7 January 2002 Paper

Quantitative phase contrast tomography using coherent synchrotron radiation

Peter Cloetens, Wolfgang Ludwig, Elodie Boller, Lukas Helfen, Luc Salvo, Regis Mache, Michel Schlenker

Proceedings Volume 4503, (2002) https://doi.org/10.1117/12.452867

KEYWORDS: Absorption, Tomography, Sensors, X-rays, Refractive index, Phase contrast, Synchrotron radiation, Near field diffraction, Spatial frequencies, Reconstruction algorithms

Read Abstract +

Showing 5 of 7 publications

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years