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Dr. Maciej T. Knapczyk
SPIE Involvement:
Author
Area of Expertise:
laser diodes , Digital Signal Processing , LabVIEW , Data Acquisition and Processing
Profile Summary
Scientist, researcher and engineer with over 10 years of hands-on R&D experience involving theoretical and practical work in optics, photonics, physics, electrical engineering and telecommunication.
Skilled operator of sophisticated laboratory instrumentation for optical and electrical testing, software developer, photographer.
Publications (5)
Proceedings Article | 9 February 2012 Paper
Record-brightness laser-diode bars for fiber coupling
M. Dogan, R. Pathak, S. Ellison, H. Eppich, G. Campbell, J. Vignati, J. Jacob, K. Lang, R. Chin, M. Knapczyk, W. Sun, S. Fulghum, A. Chin
Proceedings Volume 8241, 82410G (2012) https://doi.org/10.1117/12.908673
KEYWORDS: Fiber lasers, Fiber couplers, Fiber coupled lasers, Reliability, Semiconductor lasers, Failure analysis, Resistance, Collimation, Laser applications
Proceedings Article | 21 February 2011 Paper
70% efficient near 1kW single 1-cm laser-diode bar at 20°C
M. Knapczyk, J. Jacob, H. Eppich, A. Chin, K. Lang, J. Vignati, R. Chin
Proceedings Volume 7918, 79180F (2011) https://doi.org/10.1117/12.873179
KEYWORDS: Resistance, Semiconductor lasers, Lithium, Laser applications, Analytical research, Continuous wave operation, High power lasers, Diodes, Copper, Gallium arsenide
Proceedings Article | 21 February 2011 Paper
Record CW-brightness from a single 20% fill-factor 1-cm laser-diode bar at 20°C
A. Chin, M. Knapczyk, J. Jacob, H. Eppich, K. Lang, R. Chin, M. Dogan
Proceedings Volume 7918, 79180L (2011) https://doi.org/10.1117/12.873183
KEYWORDS: Semiconductor lasers, Reliability, Indium, Fiber lasers, Resistance, Laser applications, Continuous wave operation, Copper, Temperature metrology, Heatsinks
Proceedings Article | 24 February 2009 Paper
Fault protection of broad-area laser diodes
J. Jacob, R. Petr, M. Jaspan, S. Swartz, M. Knapczyk, A. Flusberg, A. Chin, I. Smilanski
Proceedings Volume 7198, 719815 (2009) https://doi.org/10.1117/12.807717
KEYWORDS: Semiconductor lasers, Near field optics, Optical resonators, Active optics, Optics manufacturing, Electronics, Diodes, High power lasers, Absorption, Laser scattering
Proceedings Article | 24 February 2009 Paper
A comprehensive model of catastrophic optical-damage in broad-area laser diodes
A. Chin, R. Bertaska, M. Jaspan, A. Flusberg, S. Swartz, M. Knapczyk, R. Petr, I. Smilanski, J. Jacob
Proceedings Volume 7198, 71981A (2009) https://doi.org/10.1117/12.804834
KEYWORDS: Semiconductor lasers, Near field optics, Near field, Electroluminescence, Scanning transmission electron microscopy, Interfaces, Crystals, Laser optics, Diodes, Aluminum
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