Maciej Stankiewicz
at Wroclaw Univ of Technology
SPIE Involvement:
Author
Area of Expertise:
Vision Systems
Websites:
Publications (2)

Proceedings Article | 27 May 2011 Paper
J. Reiner, G. Kotnarowski, M. Stankiewicz
Proceedings Volume 8082, 808233 (2011) https://doi.org/10.1117/12.889469
KEYWORDS: 3D modeling, Cameras, Solid modeling, 3D metrology, Laser systems engineering, Systems modeling, Imaging systems, 3D image processing, Chemical elements, Computer aided design

Proceedings Article | 17 June 2009 Paper
J. Reiner, M. Wójcik, M. Stankiewicz
Proceedings Volume 7389, 73890A (2009) https://doi.org/10.1117/12.827482
KEYWORDS: Cameras, Inspection, 3D modeling, Reflection, Image segmentation, Distortion, Reflectivity, Algorithm development, Light scattering, 3D image processing

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top