Recently, the progressive contamination of photomasks has become a major concern for long-term LCD-TFT
manufacturing, as it is the cause of significant defects. We have deciphered the chemical structure and growth
mechanism of progressive contamination, and have devised an accelerated test procedure which simulates 2 years of
TFT processes in order to determine how best to inhibit its growth (UG Series). By using the photomask with a new type
of pellicle (UG series), we were able to inhibit the growth of progressive contamination to the extent that no
contamination was confirmed on the photomask for approximately two years.
Electron emission from the surface of copper target irradiated with femtsecond pulsed laser (wavelength 800nm, pulse width 100fs) was measured at the atmospheric pressure. A tiny metal probe was used to detect the electric potential made by the charged particles. It was found that the energy of emitted electrons became higher gradually when laser irradiation was repeated on the same spot.
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