Prof. Malgorzata Kujawinska
Head of Div at Warsaw Univ of Technology
SPIE Involvement:
Conference Program Committee | Track Chair | Author | Editor
Publications (219)

Proceedings Article | 15 August 2023 Presentation + Paper
Proceedings Volume 12618, 126181Q (2023) https://doi.org/10.1117/12.2673881
KEYWORDS: Digital image correlation, 3D metrology, Laser soldering, 3D tracking, Optical spheres, Calibration, 3D image processing, Cameras, Engineering, Imaging systems

Proceedings Article | 11 August 2023 Presentation + Paper
Proceedings Volume 12622, 126220O (2023) https://doi.org/10.1117/12.2673869
KEYWORDS: Biofilms, Diffusion, Polarization, Refractive index, Imaging systems, Phase interferometry, Interferograms, Optical path differences, Beam splitters, Matrices

Proceedings Article | 9 August 2023 Presentation + Paper
Proceedings Volume 12621, 126210P (2023) https://doi.org/10.1117/12.2673675
KEYWORDS: Phase unwrapping, Reconstruction algorithms, Tomography, Scattering, Holography, Data modeling, Denoising, Image segmentation, Education and training, 3D modeling

Proceedings Article | 16 March 2023 Presentation + Paper
Maria Baczewska, Milena Królikowska, Martyna Mazur, Paulina Laskowska, Zofia Dziekan, Piotr Mrówka, Wojciech Krauze, Małgorzata Kujawińska
Proceedings Volume 12389, 1238907 (2023) https://doi.org/10.1117/12.2649977
KEYWORDS: Digital holography, Raman spectroscopy, Holography, Tomography, Microscopes, Chemical analysis, Refractive index, Phase imaging

Proceedings Article | 16 March 2023 Presentation + Paper
M. Ziemczonok, M. Kujawińska
Proceedings Volume 12389, 1238908 (2023) https://doi.org/10.1117/12.2649720
KEYWORDS: Design and modelling, Refractive index, Fabrication, Scanning electron microscopy, Printing, Polymers, Voxels, Two photon polymerization, Metrology, Scattering

Showing 5 of 219 publications
Proceedings Volume Editor (16)

SPIE Conference Volume | 30 November 2018

SPIE Conference Volume | 13 May 2008

SPIE Conference Volume | 12 May 2006

SPIE Conference Volume | 30 May 2003

SPIE Conference Volume | 23 October 2001

Showing 5 of 16 publications
Conference Committee Involvement (72)
Optical Metrology and Inspection for Industrial Applications XI
12 October 2024 | Nantong, Jiangsu, China
Optical Metrology and Inspection for Industrial Applications X
15 October 2023 | Beijing, China
Advanced Optical Imaging Technologies VI
14 October 2023 | Beijing, China
Holography: Advances and Modern Trends VIII
24 April 2023 | Prague, Czech Republic
Optical Metrology and Inspection for Industrial Applications IX
5 December 2022 | Online Only, China
Showing 5 of 72 Conference Committees
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