Prof. Mamoru Yoshimoto
at Tokyo Institute of Technology
SPIE Involvement:
Author
Publications (8)

Proceedings Article | 11 April 2024 Presentation
Satoru Kaneko, Takashi Tokumasu, Daishi Shiojiri, Manabu Yasui, Masahito Kurouchi, Masahiko Mitsuhashi, Chihiro Kato, Satomi Tanaka, Shigeo Yasuhara, Musa Can, Ruei-Sung Yu, Sumanta Shaoo, Kripasindhu Sardar, Masahiro Yoshimura, Akifumi Matsuda, Mamoru Yoshimoto
Proceedings Volume PC12939, PC129390I (2024) https://doi.org/10.1117/12.3000129
KEYWORDS: Oxides, Silicon, Graphene, Semiconductors, Dielectrics, Chemical vapor deposition, Thermal stability, Carbon dioxide, Thermodynamics, Silicon carbide

Proceedings Article | 16 February 2012 Paper
Satoru Kaneko, Takeshi Ito, Manabu Yasui, Chihiro Kato, Satomi Tanaka, Takeshi Ozawa, Yasuo Hirabayashi, Akira Matsuno, Takashi Nire, Mamoru Yoshimoto
Proceedings Volume 8243, 82430U (2012) https://doi.org/10.1117/12.905970
KEYWORDS: Continuous wave operation, Nanostructures, Silicon, Near infrared, Semiconductor lasers, Femtosecond phenomena, Laser irradiation, Scanning electron microscopy, Raman spectroscopy, Pulsed laser operation

Proceedings Article | 24 February 2009 Paper
Yasuyuki Akita, Yuki Sugimoto, Masahiro Mita, Hideo Oi, Osami Sakata, Mamoru Yoshimoto
Proceedings Volume 7201, 72011A (2009) https://doi.org/10.1117/12.808096
KEYWORDS: Glasses, Thin films, Sapphire, Crystals, Nanostructures, Annealing, Oxides, Thin film deposition, Nanolithography, Pulsed laser deposition

Proceedings Article | 14 February 2008 Paper
Wakana Hara, Mamoru Yoshimoto
Proceedings Volume 6879, 68790V (2008) https://doi.org/10.1117/12.773283
KEYWORDS: Thin films, Sapphire, Aluminum nitride, Oxides, Ferroelectric materials, Epitaxy, Crystals, Chemical species, Atomic force microscopy, Nanowires

Proceedings Article | 23 April 2001 Paper
Parhat Ahmet, Takashi Koida, Masahiro Takakura, Kiyomi Nakajima, Miyoko Tanaka, Masaki Takeguchi, Mamoru Yoshimoto, Hideomi Koinuma, Toyohiro Chikyow
Proceedings Volume 4281, (2001) https://doi.org/10.1117/12.424758
KEYWORDS: Silicon, Interfaces, Thin films, Oxygen, Crystals, Diffusion, Pulsed laser deposition, Temperature metrology, Photomicroscopy, Transmission electron microscopy

Showing 5 of 8 publications
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