Maor Tiferet
at Bar-Ilan Univ
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 2 March 2020 Paper
Proceedings Volume 11267, 1126706 (2020) https://doi.org/10.1117/12.2545949
KEYWORDS: Silicon, Waveguides, Semiconductor lasers, Refractive index, Refraction, Crystals, Absorption, Scanning electron microscopy, Silicon photonics, Semiconducting wafers

Proceedings Article | 21 February 2020 Paper
Proceedings Volume 11254, 1125407 (2020) https://doi.org/10.1117/12.2546318
KEYWORDS: Laser beam diagnostics, Semiconductor lasers, Infrared imaging, Infrared lasers, Diffraction

Proceedings Article | 5 March 2019 Paper
Proceedings Volume 10891, 1089107 (2019) https://doi.org/10.1117/12.2508535
KEYWORDS: Silicon, Beam shaping, Absorption, Point spread functions, Diffraction, Super resolution, Refractive index

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