Dr. Marcell Pálmai
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 4 August 2021 Presentation
Proceedings Volume 11800, 1180004 (2021) https://doi.org/10.1117/12.2595461
KEYWORDS: Nanomaterials, X-ray characterization, Doping, Semiconductors, Quantum dots, Ions, Algorithm development, X-rays, X-ray diffraction, Statistical analysis

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