Dr. Marcelo D. Ackermann
R&D Specialist at Helbling Technik Bern AG
SPIE Involvement:
Publications (33)

SPIE Journal Paper | 25 April 2016
JATIS Vol. 2 Issue 02
KEYWORDS: Diffraction gratings, Magnesium, X-rays, Diffraction, Silicon, Spectroscopy, Sensors, Point spread functions, Semiconducting wafers, Etching

SPIE Journal Paper | 22 December 2015
JATIS Vol. 1 Issue 04
KEYWORDS: Spectrographs, Diffraction gratings, Silicon, Sensors, X-rays, Charge-coupled devices, Astronomical imaging, Telescopes, Diffraction, CCD image sensors

Proceedings Article | 4 September 2015 Paper
Proc. SPIE. 9603, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VII
KEYWORDS: Observatories, Telescopes, Mirrors, X-ray optics, Silica, Silicon, Manufacturing, Space telescopes, X-ray telescopes, Semiconducting wafers

Proceedings Article | 12 May 2015 Paper
Proc. SPIE. 9510, EUV and X-ray Optics: Synergy between Laboratory and Space IV
KEYWORDS: Point spread functions, Spectrographs, X-ray optics, Sensors, Dispersion, X-rays, Silicon, Charge-coupled devices, CCD image sensors, Semiconducting wafers

Proceedings Article | 24 July 2014 Paper
Proc. SPIE. 9144, Space Telescopes and Instrumentation 2014: Ultraviolet to Gamma Ray
KEYWORDS: Wafer-level optics, Point spread functions, Mirrors, Optical design, X-ray optics, X-rays, Silicon, Spatial resolution, Semiconducting wafers, Optics manufacturing

Showing 5 of 33 publications
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