Dr. Marco Jupé Profile

Dr. Marco Jupé

Group Lead at Laser Zentrum Hannover eV

SPIE Involvement:

Author

Publications (49)

Proceedings Article | 11 September 2020 Presentation

Electrical and optical properties linked to laser damage behavior in indium tin oxide

Morten Steinecke, Jonas Matthes, Lars Jensen, Marco Jupé, Detlev Ristau

Proc. SPIE. 11514, Laser-induced Damage in Optical Materials 2020

KEYWORDS: Thin films, Optical filters, Switches, Optical properties, Mode locking, Laser induced damage, Control systems, Integrated optics, Active optics, Electrooptic modulators

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Proceedings Article | 20 November 2019 Presentation + Paper

Third harmonic (TH) generation: a tool to study dielectric material properties near the laser induced damage threshold (LIDT)

Amir Khabbazi Oskouei, Luke Emmert, Morten Steinecke, Marco Jupé, Detlev Ristau, Lars Jensen, Wolfgang Rudolph

Proc. SPIE. 11173, Laser-induced Damage in Optical Materials 2019

KEYWORDS: Optical filters, Refractive index, Mirrors, Laser induced damage, Dielectrics, Electrons, Kerr effect, Laser damage threshold, Plasma, Absorption

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Proceedings Article | 20 November 2018 Paper

Measurement setup for the determination of the nonlinear refractive index of thin films with high nonlinearity

Morten Steinecke, Tarik Kellermann, Marco Jupé, Detlev Ristau, Lars Jensen

Proc. SPIE. 10805, Laser-Induced Damage in Optical Materials 2018: 50th Anniversary Conference

KEYWORDS: Thin films, Refractive index, Beam splitters, Manufacturing, Interferometry, Wavefronts, Kerr effect, Nonlinear optics, Laser damage threshold, Optics manufacturing

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Proceedings Article | 16 November 2018 Paper

Study of the role of the interface on the defect density in HfO2 films using STEREO-LID (Spatio-TEmporally REsolved Optical Laser-Induced Damage)

Luke Emmert, Sebastian Töpfer, Thomas Willemsen, Marco Jupé, Detlev Ristau, Wolfgang Rudolph

Proc. SPIE. 10805, Laser-Induced Damage in Optical Materials 2018: 50th Anniversary Conference

KEYWORDS: Multilayers, Silica, Sputter deposition, Laser induced damage, Interfaces, Ion beams, Laser damage threshold, Laser optics, Hybrid fiber optics, Absorption

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Proceedings Article | 16 November 2018 Paper

Femtosecond laser-induced modifications of frequency tripling mirrors

Amir Khabbazi Oskouei, Sebastian Baur, Luke Emmert, Marco Jupe, Thomas Willemsen, Morten Steinecke, Lars Jensen, Detlev Ristau, Wolfgang Rudolph

Proc. SPIE. 10805, Laser-Induced Damage in Optical Materials 2018: 50th Anniversary Conference

KEYWORDS: Thin films, Refractive index, Mirrors, Femtosecond phenomena, Silica, Reflection, Dielectrics, Third-harmonic generation, Temperature metrology, Absorption

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Proceedings Article | 22 March 2018 Paper

Measurement of the nonlinear refractive index in optical thin films

M. Steinecke, M. Jupé, K. Kiedrowski, D. Ristau

Proc. SPIE. 10447, Laser-Induced Damage in Optical Materials 2017

KEYWORDS: Thin films, Refractive index, Coating, Interferometry, Wavefronts, Kerr effect, Optical testing, Nonlinear optics

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Proceedings Article | 22 March 2018 Paper

Approaches toward optimized laser-induced damage thresholds of dispersive compensating mirrors applying nanolaminates

T. Willemsen, M. Brinkmann, M. Jupé, M. Gyamfi, S. Schlichting, D. Ristau

Proc. SPIE. 10447, Laser-Induced Damage in Optical Materials 2017

KEYWORDS: Refractive index, Mirrors, Quantum wells, Dielectrics, Laser damage threshold, Optics manufacturing

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Proceedings Article | 6 December 2016 Paper

Electronic quantization in dielectric nanolaminates

T. Willemsen, P. Geerke, M. Jupé, L. Gallais, D. Ristau

Proc. SPIE. 10014, Laser-Induced Damage in Optical Materials 2016

KEYWORDS: Refractive index, Quantum wells, Composites, Dielectrics, Electrons, Manufacturing, Quantization, Laser damage threshold, Hybrid fiber optics, Optics manufacturing

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Proceedings Article | 6 December 2016 Paper

Ultrafast polychromatic ionization of dielectric solids

P. Jürgens, M. Jupé, M. Gyamfi, D. Ristau

Proc. SPIE. 10014, Laser-Induced Damage in Optical Materials 2016

KEYWORDS: Ultrafast phenomena, Laser induced damage, Photons, Dielectrics, Electrons, Solids, Ionization, Laser damage threshold, Pulsed laser operation, Absorption

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The modeling of the laser-induced damage processes can be divided into thermal and electronic processes. Especially, electronic damage seems to be well understood. In corresponding models, the damage threshold is linked to the excitation of valence electrons into the conduction band, and often the damage is obtained if a critical density of free electrons is exceeded. For the modeling of the electronic excitation, rate equation models are applied which can vary in the different terms representing different excitation channels. According to the current state of the art, photoionization and avalanche ionization contribute the major part to the ionization process, and consequently the determination of laser-induced damage thresholds is based on the calculation of the respective terms. For the theoretical description of both, well established models are available. For the quantitative calculation of the photoionization, the Keldysh theory is used most frequently, and for the avalanche processes the Drude theory is often applied. Both, Drude and Keldysh theory calculations depend on the laser frequency and use a monochromatic approach. For most applications the monochromatic description matches very well with the experimental findings, but in the range of few-cycle pulses the necessary broadening of the laser emission spectrum leads to high uncertainty for the calculation. In this paper, a novel polychromatic approach is presented including photo- and avalanche ionization as well as the critical electron density. The simulation combines different ionization channels in a Monte-Carlo procedure according to the frequency distribution of the spectrum. The resulting influence on the wavelength and material dependency is discussed in detail for various pulse shapes and pulse durations. The main focus of the investigation is concentrated on the specific characteristics in the dispersion and material dependency of the laser-induced damage threshold respecting the polychromatic characteristics of the ultra-short pulse (USP) laser damage.

Proceedings Article | 6 December 2016 Paper

Improved LIDT values for dielectric dispersive compensating mirrors applying ternary composites

T. Willemsen, S. Schlichting, M. Gyamfi, M. Jupé, H. Ehlers, U. Morgner, D. Ristau

Proc. SPIE. 10014, Laser-Induced Damage in Optical Materials 2016

KEYWORDS: Mirrors, Curium, Detection and tracking algorithms, Laser induced damage, Composites, Dielectrics, Laser damage threshold, Tantalum, Dielectric mirrors, Reverse engineering

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Proceedings Article | 23 September 2015 Paper

Simulation in thin film technology

Marcus Turowski, Marco Jupé, Henrik Ehlers, Thomas Melzig, Andreas Pflug, Detlev Ristau

Proc. SPIE. 9627, Optical Systems Design 2015: Advances in Optical Thin Films V

KEYWORDS: Thin films, Titanium dioxide, Optical properties, Sputter deposition, Particles, Coating, Computer simulations, Monte Carlo methods, Thin film growth, Fused deposition modeling

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Proceedings Article | 23 September 2015 Paper

Precise fabrication of ultra violet dielectric dispersion compensating mirrors

T. Willemsen, S. Schlichting, T. Kellermann, M. Jupé, H. Ehlers, U. Morgner, D. Ristau

Proc. SPIE. 9627, Optical Systems Design 2015: Advances in Optical Thin Films V

KEYWORDS: Near infrared, Mirrors, Silica, Spectroscopy, Ultraviolet radiation, In situ metrology, Reflectivity, Solids, Dielectric mirrors, Dielectric dispersion

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Proceedings Article | 23 September 2015 Paper

Optimization of novel phase separating IBS process

Marco Jupé, Thomas Willemsen, Sina Malobabic, Kornelia Schuba, Detlev Ristau

Proc. SPIE. 9627, Optical Systems Design 2015: Advances in Optical Thin Films V

KEYWORDS: Sputter deposition, Particles, Electrons, Ions, Optical coatings, Magnetism, Ion beams, Ionization, Thin film coatings, Particle contamination

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Proceedings Article | 23 September 2015 Paper

Multiple scale modeling of Al2O3 thin film growth in an ion beam sputtering process

Marcus Turowski, Marco Jupé, Thomas Melzig, Andreas Pflug, Detlev Ristau

Proc. SPIE. 9627, Optical Systems Design 2015: Advances in Optical Thin Films V

KEYWORDS: Thin films, Chemical species, Sputter deposition, Coating, Oxygen, Monte Carlo methods, Refraction, Ion beams, Aluminum, Thin film growth

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Proceedings Article | 14 November 2013 Paper

Algorithm for cumulative damage probability calculations in S-on-1 laser damage testing

Stefan Schrameyer, Marco Jupé, Lars Jensen, Detlev Ristau

Proc. SPIE. 8885, Laser-Induced Damage in Optical Materials: 2013

KEYWORDS: Data modeling, Laser induced damage, Error analysis, Optical coatings, Nonlinear optics, Laser damage threshold, Analog electronics, Laser optics, Pulsed laser operation, Standards development

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Proceedings Article | 4 December 2012 Paper

Parallel use of detection channels for LIDT testing in the UV-Range

S. Schrameyer, M. Jupé, L. Jensen, D. Ristau

Proc. SPIE. 8530, Laser-Induced Damage in Optical Materials: 2012

KEYWORDS: Scattering, Sensors, Laser induced damage, Light scattering, Coating, Laser scattering, Reflectivity, Transmittance, Laser damage threshold, Signal detection

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Proceedings Article | 29 November 2012 Paper

An exhaustive study of laser damage in ion beam sputtered pure and mixture oxide thin films at 1030 nm with 500 fs pulse durations

Laurent Gallais, Benoit Mangote, Mireille Commandré, Mathias Mende, Lars Jensen, Henrik Ehlers, Marco Jupé, Detlev Ristau, Andrius Melninkaitis, Valdas Sirutkaitis, Simonas Kičas, Tomas Tolenis, Ramutis Drazdys

Proc. SPIE. 8530, Laser-Induced Damage in Optical Materials: 2012

KEYWORDS: Oxides, Thin films, Refractive index, Silica, Laser induced damage, Optical coatings, Ion beams, Laser damage threshold, Thin film coatings, Zirconium dioxide

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Proceedings Article | 23 November 2011 Paper

Measurement and calculation of ternary oxide mixtures for thin films for ultra short pulse laser optics

M. Jupé, M. Mende, C. Kolleck, D. Ristau, L. Gallais, B. Mangote

Proc. SPIE. 8190, Laser-Induced Damage in Optical Materials: 2011

KEYWORDS: Oxides, Thin films, Silica, Dielectrics, Ions, Solids, Ionization, Laser damage threshold, Pulsed laser operation, Temperature metrology

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Proceedings Article | 4 October 2011 Paper

Investigation of ion beam properties and coating material during IBS

M. Jupé, S. Malobabic, C. Schmitz, C. Gouldieff, H. Steffen, R. Wiese, D. Ristau

Proc. SPIE. 8168, Advances in Optical Thin Films IV

KEYWORDS: Titanium, Silica, Particles, Dielectrics, Ions, Coating, Oxygen, Ion beams, Radiofrequency ablation, Plasma

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Proceedings Article | 2 December 2010 Paper

Linear and non-linear absorption of Ti(x)Si(1-x)O2-Mixtures

M. Jupé, L. Jensen, S. Malobabic, D. Ristau, K. Starke

Proc. SPIE. 7842, Laser-Induced Damage in Optical Materials: 2010

KEYWORDS: Oxides, Optical components, Silica, Dielectrics, Electrons, Coating, Ion beams, Ionization, Temperature metrology, Absorption

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Proceedings Article | 2 December 2010 Paper

Calculation and measurement of fs-LIDT of TixSi(1-x)O2-mixtures

M. Jupé, L. Jensen, M. Mende, D. Ristau, A. Melninkaitis, V. Sirutkaitis, D. Nguyen, L. Emmert, W. Rudolph

Proc. SPIE. 7842, Laser-Induced Damage in Optical Materials: 2010

KEYWORDS: Oxides, Titanium dioxide, Silica, Laser induced damage, Dielectrics, Electrons, Coating, Ionization, Pulsed laser operation, Absorption

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