Dr. Marina Mariano Juste
at imec
SPIE Involvement:
Author
Publications (6)

Proceedings Article | 17 October 2019 Presentation
Proceedings Volume 11148, 111480Z (2019) https://doi.org/10.1117/12.2539262
KEYWORDS: Pellicles, Extreme ultraviolet, Extreme ultraviolet lithography, Particles, Semiconducting wafers, Wafer inspection, Photomasks, Scanners, Tolerancing

SPIE Journal Paper | 13 March 2019
JM3, Vol. 18, Issue 01, 014002, (March 2019) https://doi.org/10.1117/12.10.1117/1.JMM.18.1.014002
KEYWORDS: Pellicles, Extreme ultraviolet, Scattering, Reticles, Diffraction, Image quality, Inspection, Coating, Photomasks, Carbon nanotubes

SPIE Journal Paper | 27 November 2018
Marina Y. Timmermans, Marina Mariano, Ivan Pollentier, Olivier Richard, Cedric Huyghebaert, Emily Gallagher
JM3, Vol. 17, Issue 04, 043504, (November 2018) https://doi.org/10.1117/12.10.1117/1.JMM.17.4.043504
KEYWORDS: Pellicles, Extreme ultraviolet, Extreme ultraviolet lithography, Particles, Carbon nanotubes, Coating, Scanners, Hydrogen, Inspection, Photomasks

Proceedings Article | 3 October 2018 Presentation + Paper
Proceedings Volume 10810, 108100Y (2018) https://doi.org/10.1117/12.2502480
KEYWORDS: Pellicles, Extreme ultraviolet, Scattering, Diffraction, Reticles, Image quality, Inspection, Coating

Proceedings Article | 23 April 2018 Presentation + Paper
Proceedings Volume 10583, 105831E (2018) https://doi.org/10.1117/12.2297710
KEYWORDS: Pellicles, Extreme ultraviolet, Particles, Extreme ultraviolet lithography, Semiconducting wafers, Photomasks, Scanners, Scattering, Silicon, Hydrogen

Showing 5 of 6 publications
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