Mark A. Manzardo
EO Engineer
SPIE Involvement:
Author
Publications (10)

Proceedings Article | 19 July 1999 Paper
Proc. SPIE. 3697, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing IV
KEYWORDS: Nonuniformity corrections, Infrared sensors, Infrared imaging, Optical design, Sensors, Interfaces, Control systems, Projection systems, Infrared radiation, Forward looking infrared

Proceedings Article | 19 July 1999 Paper
Proc. SPIE. 3697, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing IV
KEYWORDS: Infrared search and track, Nonuniformity corrections, Infrared sensors, Infrared imaging, Sensors, Control systems, Projection systems, Infrared radiation, Resistors, Missiles

Proceedings Article | 19 July 1999 Paper
Proc. SPIE. 3697, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing IV
KEYWORDS: Nonuniformity corrections, Infrared imaging, Sensors, Calibration, Image processing, Composites, Distortion, Projection systems, Infrared radiation, Resistors

Proceedings Article | 19 July 1999 Paper
Proc. SPIE. 3697, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing IV
KEYWORDS: Long wavelength infrared, Nonuniformity corrections, Infrared imaging, Electronics, Sensors, Calibration, Projection systems, Infrared radiation, Radiometry, Resistors

Proceedings Article | 13 July 1998 Paper
Proc. SPIE. 3368, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing III
KEYWORDS: Nonuniformity corrections, Infrared imaging, Sensors, Calibration, Image processing, Interfaces, Image sensors, Projection systems, Infrared radiation, Frame grabbers

Showing 5 of 10 publications
Conference Committee Involvement (4)
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XI
18 April 2006 | Orlando (Kissimmee), Florida, United States
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing X
29 March 2005 | Orlando, Florida, United States
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing IX
13 April 2004 | Orlando, Florida, United States
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VIII
21 April 2003 | Orlando, Florida, United States
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