Dr. Marko Vogler
at micro resist technology GmbH
SPIE Involvement:
Author
Publications (8)

Proceedings Article | 3 April 2015 Paper
A. Schleunitz, J. Klein, R. Houbertz, M. Vogler, G. Gruetzner
Proceedings Volume 9368, 93680E (2015) https://doi.org/10.1117/12.2076252
KEYWORDS: Polymers, Optics manufacturing, Waveguides, Lithography, Microlens, Optical components, Optical interconnects, Manufacturing, Ultraviolet radiation, Nanoimprint lithography

SPIE Journal Paper | 21 October 2014
Manuel Thesen, Dieter Nees, Stephan Ruttloff, Maximilian Rumler, Mathias Rommel, Florian Schlachter, Susanne Grützner, Marko Vogler, Arne Schleunitz, Gabi Grützner
JM3, Vol. 13, Issue 04, 043003, (October 2014) https://doi.org/10.1117/12.10.1117/1.JMM.13.4.043003
KEYWORDS: Nanoimprint lithography, Etching, Silicon, Dry etching, Polymers, Photoresist processing, Nickel, Inkjet technology, Nanostructures, Reactive ion etching

SPIE Journal Paper | 5 September 2014
Giuseppe Calafiore, Scott Dhuey, Simone Sassolini, Nerea Alayo, David Gosselin, Marko Vogler, Deidre Olynick, Christophe Peroz, Stefano Cabrini
JM3, Vol. 13, Issue 03, 033013, (September 2014) https://doi.org/10.1117/12.10.1117/1.JMM.13.3.033013
KEYWORDS: Nanoimprint lithography, Metals, Multilayers, Etching, Polymethylmethacrylate, Optical lithography, Plasma, Ultraviolet radiation, Silicon films, Scanning electron microscopy

Proceedings Article | 28 March 2014 Paper
Manuel Thesen, Maximilian Rumler, Florian Schlachter, Susanne Grützner, Christian Moormann, Mathias Rommel, Dieter Nees, Stephan Ruttloff, Stefan Pfirrmann, Marko Vogler, Arne Schleunitz, Gabi Grützner
Proceedings Volume 9049, 90490H (2014) https://doi.org/10.1117/12.2046279
KEYWORDS: Nanoimprint lithography, Etching, Dry etching, Silicon, Photoresist processing, Positron emission tomography, Surface roughness, Semiconducting wafers, Nanostructures, Refractive index

Proceedings Article | 7 March 2014 Paper
G. Gruetzner, J. Klein, M. Vogler, A. Schleunitz
Proceedings Volume 8974, 897406 (2014) https://doi.org/10.1117/12.2043038
KEYWORDS: Polymers, Ultraviolet radiation, Refractive index, Nanofabrication, Lithography, Transmittance, Optical lithography, Carbon dioxide, UV optics, Optics manufacturing

Showing 5 of 8 publications
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