Dr. Markus Osterhoff Profile

Dr. Markus Osterhoff

Staff Scientist at University of Göttingen

SPIE Involvement:

Conference Program Committee | Author

Area of Expertise:

partial coherence , x-ray holography

Websites:

Company Website | Personal Website

Proceedings Article | 7 September 2017 Paper

Faster scanning and higher resolution: new setup for multilayer zone plate imaging

Markus Osterhoff, Jakob Soltau, Christian Eberl, Hans-Ulrich Krebs

Proceedings Volume 10389, 103890T (2017) https://doi.org/10.1117/12.2271141

KEYWORDS: Zone plates, Scanners, Hard x-rays, X-ray optics, X-rays

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Proceedings Article | 7 September 2017 Paper

Simulations and experiments on vibration damping for zoom-holography and nano-scanning at the GINIX

Markus Osterhoff, Peter Luley, Michael Sprung, Tim Salditt

Proceedings Volume 10389, 103890D (2017) https://doi.org/10.1117/12.2271140

KEYWORDS: Holography, Nanoimaging, Waveguides, X-ray imaging, X-rays, Tomography

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Proceedings Article | 23 August 2017 Paper

Aberrations in compound refractive lens systems: analytical and numerical calculations

Markus Osterhoff, Carsten Detlefs, Claudio Ferrero

Proceedings Volume 10388, 103880L (2017) https://doi.org/10.1117/12.2275535

KEYWORDS: Zernike polynomials, Hard x-rays, Optical alignment

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Proceedings Article | 23 August 2017 Paper

Ultra-high-aspect multilayer zone plates for even higher x-ray energies

Markus Osterhoff, Jakob Soltau, Christian Eberl, Hans-Ulrich Krebs

Proceedings Volume 10386, 1038608 (2017) https://doi.org/10.1117/12.2271139

KEYWORDS: Zone plates, X-ray optics, X-rays, Multilayers, Hard x-rays

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Proceedings Article | 18 September 2015 Paper

Progress on multi-order hard x-ray imaging with multilayer zone plates

Markus Osterhoff, Florian Döring, Christian Eberl, Robin Wilke, Jesper Wallentin, Hans-Ulrich Krebs, Michael Sprung, Tim Salditt

Proceedings Volume 9592, 95920E (2015) https://doi.org/10.1117/12.2187799

KEYWORDS: Zone plates, Hard x-rays, X-rays, X-ray optics, Lenses, Holography, Holograms, Diffraction, Sensors, Mirrors

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Proceedings Article | 26 August 2015 Paper

MZP design and fabrication for efficient hard x-ray nano-focusing and imaging

Christian Eberl, Markus Osterhoff, Florian Döring, Hans-Ulrich Krebs

Proceedings Volume 9588, 958808 (2015) https://doi.org/10.1117/12.2187788

KEYWORDS: Multilayers, Hard x-rays, Transmission electron microscopy, Glasses, X-ray optics, Zirconium dioxide, X-rays, Ions, Scanning electron microscopy, Zone plates

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Proceedings Article | 27 September 2013 Paper

Two-dimensional sub-5-nm hard x-ray focusing with MZP

Markus Osterhoff, Matthias Bartels, Florian Döring, Christian Eberl, Thomas Hoinkes, Sarah Hoffmann, Tobias Liese, Volker Radisch, Arno Rauschenbeutel, Anna-Lena Robisch, Aike Ruhlandt, Felix Schlenkrich, Tim Salditt, Hans-Ulrich Krebs

Proceedings Volume 8848, 884802 (2013) https://doi.org/10.1117/12.2025389

KEYWORDS: Mirrors, Lenses, Sensors, Hard x-rays, Glasses, X-rays, Zone plates, Diffraction, Multilayers, X-ray optics

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Proceedings Article | 15 October 2012 Paper

Application of wave optical simulations to focusing x-ray multilayers

M. Osterhoff, Ch. Morawe

Proceedings Volume 8502, 850208 (2012) https://doi.org/10.1117/12.928938

KEYWORDS: Mirrors, Solids, Diffraction, Reflectivity, X-rays, Optical simulations, Computer simulations, X-ray optics, Software development, Optical components

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Proceedings Article | 23 September 2011 Paper

Partially coherent x-ray beam simulations: mirrors and more

Markus Osterhoff, Tim Salditt

Proceedings Volume 8141, 81410C (2011) https://doi.org/10.1117/12.893003

KEYWORDS: X-rays, Stochastic processes, Mirrors, Wave propagation, Waveguides, Lenses, Superposition, Coherence imaging, Coherence (optics), Synchrotron radiation

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Proceedings Article | 19 May 2011 Paper

Multilayer white beam study

K. Friedrich, Ch. Morawe, J.-Ch. Peffen, M. Osterhoff

Proceedings Volume 8077, 80770M (2011) https://doi.org/10.1117/12.887000

KEYWORDS: Reflectivity, Multilayers, X-rays, Monochromators, Zirconium, Synchrotrons, Transmission electron microscopy, Sensors, Radiation effects, Silicon

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Showing 5 of 10 publications

Conference Committee Involvement (2)

Advances in X-Ray/EUV Optics and Components XIX

19 August 2024 | San Diego, California, United States

Advances in X-Ray/EUV Optics and Components XVIII

22 August 2023 | San Diego, California, United States

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