Dr. Markus K. Tilsch Profile

Dr. Markus K. Tilsch

Manager, Coating R&D at VIAVI Solutions Inc

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Publications (7)

Proceedings Article | 18 June 2024 Presentation

Challenges and accomplishments in optical coatings faced by industry today

Markus Tilsch

Proceedings Volume PC13020, PC1302001 (2024) https://doi.org/10.1117/12.3025128

KEYWORDS: Optical coatings, Industry, Free space optics, Consumer electronics, Wavefront aberrations, Tunable filters, Optical filters, Miniaturization, Metrology, Free space optical communications

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Proceedings Article | 25 September 2008 Paper

Forces in rotary motion systems

Markus Tilsch, Gregory Elliott

Proceedings Volume 7101, 71010E (2008) https://doi.org/10.1117/12.797479

KEYWORDS: Planetary systems, Planets, Polishing, Aluminum, Silicon, Coating, Glasses, Semiconducting wafers, Coating equipment, Kinematics

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Proceedings Article | 6 September 1999 Paper

International round-robin experiment on optical total scattering at 633 nm according to ISO/DIS 13696

Puja Kadkhoda, Claude Amra, Jean Bennett, Carole Deumie, Angela Duparre, Stefan Gliech, Christian Jolie, Helmut Kessler, Hans Lauth, Tomas Lindstroem, A. Mueller, Norbert Reng, Carl-Gustaf Ribbing, Detlev Ristau, Rainer Schuhmann, Uwe Schuhmann, Markus Tilsch

Proceedings Volume 3739, (1999) https://doi.org/10.1117/12.360187

KEYWORDS: Scattering, Laser scattering, Scatter measurement, Optical spheres, Standards development, Optical components, Laser systems engineering, Laser applications, Inspection, Laser development

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Proceedings Article | 1 October 1997 Paper

Effects of thermal annealing on ion-beam-sputtered SiO2 and TiO2 optical thin films

Markus Tilsch, Volker Scheuer, Theo Tschudi

Proceedings Volume 3133, (1997) https://doi.org/10.1117/12.279104

KEYWORDS: Annealing, Absorption, Refractive index, Crystals, Oxygen, Interfaces, Diffusion, Ion beams, Light scattering, Silica

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Proceedings Article | 19 August 1996 Paper

3D simulation of thin film growth conditions at ion beam sputter deposition and comparison to experimental investigations

Markus Tilsch, Volker Scheuer, Jochen Biersack, Theo Tschudi

Proceedings Volume 2775, (1996) https://doi.org/10.1117/12.246794

KEYWORDS: Oxygen, Ions, Particles, Sputter deposition, Absorption, Ion beams, Optical simulations, Chemical species, 3D acquisition, Silicon

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Proceedings Article | 4 November 1994 Paper

Reduction of absorption losses in ion beam sputter deposition of optical coatings for the visible and near infrared

Volker Scheuer, Markus Tilsch, Theo Tschudi

Proceedings Volume 2253, (1994) https://doi.org/10.1117/12.192118

KEYWORDS: Absorption, Sputter deposition, Oxygen, Particles, Argon, Titanium, Xenon, Ion beams, Ions, Metals

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Proceedings Article | 4 November 1994 Paper

Direct optical monitoring instrument with a double detection system for the control of multilayer systems from the visible to the near infrared

Markus Tilsch, Volker Scheuer, Josef Staub, Theo Tschudi

Proceedings Volume 2253, (1994) https://doi.org/10.1117/12.192114

KEYWORDS: Transmittance, Sensors, Control systems, Mirrors, Photodiodes, Spectroscopy, Geometrical optics, Multilayers, Monochromators, Beam splitters

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Showing 5 of 7 publications

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