Collaborative hardening and hardware redundancy are nowadays the most interesting solutions in terms of fault tolerance achieved and low extra cost imposed to the project budget. Thanks to the powerful and cheap digital devices that are available in the market, extra processing capabilities can be used for redundant tasks, not only in early data processing (sensed data) but also in routing and interfacing1
Steganalysis is a process to detect hidden data in cover documents, like digital images, videos, audio files, etc. This is the inverse process of steganography, which is the used method to hide secret messages. The widely use of computers and network technologies make digital files very easy-to-use means for storing secret data or transmitting secret messages through the Internet. Depending on the cover medium used to embed the data, there are different steganalysis methods. In case of images, many of the steganalysis and steganographic methods are focused on JPEG image formats, since JPEG is one of the most common formats. One of the main important handicaps of steganalysis methods is the processing speed, since it is usually necessary to process huge amount of data or it can be necessary to process the on-going internet traffic in real-time. In this paper, a JPEG steganalysis system is implemented in an FPGA in order to speed-up the detection process with respect to software-based implementations and to increase the throughput. In particular, the implemented method is the JPEG-compatibility detection algorithm that is based on the fact that when a JPEG image is modified, the resulting image is incompatible with the JPEG compression process.
Current circuit complexity requires faster fault injection techniques to allow the evaluation of a high number of faults in
a reasonable time. In particular, FPGA emulation has proven to be a performance effective method to analyze the
behavior of digital circuits in the presence of soft errors due to SEU effects. In general, fault emulation-based solutions
that use circuit instrumentation to inject faults in the literature does not consider the fault emulation in circuits with
embedded memories. The few existing proposals that study this kind of circuits are oriented to inject faults in
microprocessors, are slow solutions with respect to the injection in flip-flops and with a poor capacity to analyze the
circuit behavior, due to the limited accessibility in memories (a word memory per clock cycle). Embedded memories are
more and more usual and large in modern designs, and therefore, the emulation of the embedded memories is a problem
of rising importance. The proposed models presented in this work allow the fault emulation in embedded memories,
injection faults and observing their effects in a fast way.
Fault Tolerance has become an important requirement for integrated circuits, not only in safety critical applications like aerospace circuits, but also for applications working at the earth surface. Since the appearance of nanometer technologies, the sensitiveness of integrated circuits to radiation has increased notably, making the occurrence of soft errors much more frequent. Therefore, hardened circuits are currently required in many applications where fault tolerance was not a requirement in the very near past. In this paper, tools and methods for the whole hardening process of a circuit are presented: tools for the automatic insertion of fault tolerant structures in a circuit description and methods for the evaluation of fault tolerance achieved. These methods allow the evaluation of fault tolerance by means of emulation in platform FPGAs, which offer a much faster way to perform evaluation than simulation based techniques. Different circuits are used to test the proposed tool for inserting fault tolerant structures. Fault tolerance evaluation is performed using the proposed fault emulation methods, before and after applying hardening process, showing the fault tolerance improvement. The proposed techniques for evaluation have been compared, in terms of evaluation time, with previously proposed solutions and with simulation based solutions, showing improvements of several orders of magnitude.