Mr. Martin Bischoff Profile

Martin Bischoff

at Fraunhofer-IOF

SPIE Involvement:

Author

Publications (5)

Proceedings Article | 4 October 2011 Paper

Optical and mechanical properties of oxide UV coatings, prepared by PVD techniques

Olaf Stenzel, Mark Schürmann, Steffen Wilbrandt, Norbert Kaiser, Andreas Tünnermann, Mathias Mende, Henrik Ehlers, Detlev Ristau, Stefan Bruns, Michael Vergöhl, Werner Riggers, Martin Bischoff, Mario Held

Proc. SPIE. 8168, Advances in Optical Thin Films IV

KEYWORDS: Oxides, Thin films, Refractive index, Silica, Glasses, Ultraviolet radiation, Silicon, Coating, Semiconducting wafers, Temperature metrology

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Proceedings Article | 22 April 2009 Paper

Long term tests of resonator optics in ArF excimer lasers

Nils Beermann, Holger Blaschke, Henrik Ehlers, Detlev Ristau, Dirk Wulff-Molder, Sigrid Jukresch, Ansgar Matern, Martin Bischoff, Dieter Gäbler, Norbert Kaiser

Proc. SPIE. 7131, XVII International Symposium on Gas Flow, Chemical Lasers, and High-Power Lasers

KEYWORDS: Reflectors, Mirrors, Contamination, Resonators, Crystals, Interfaces, Optical coatings, Laser resonators, Excimer lasers, Laser optics

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Proceedings Article | 30 December 2008 Paper

Investigation in the degradation of CaF2 outcouplers in excimer lasers operating at 193nm

H. Blaschke, N. Beermann, H. Ehlers, D. Ristau, M. Bischoff, D. Gäbler, N. Kaiser, A. Matern, D. Wulff-Molder

Proc. SPIE. 7132, Laser-Induced Damage in Optical Materials: 2008

KEYWORDS: Reflectors, Crystals, Interfaces, Ions, Coating, Reflectivity, Carbonates, Electron microscopy, Transmittance, Excimer lasers

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Proceedings Article | 25 September 2008 Paper

Metal fluoride coatings prepared by ion-assisted deposition

Martin Bischoff, Maik Sode, Dieter Gäbler, Helmut Bernitzki, Christoph Zaczek, Norbert Kaiser, Andreas Tünnermann

Proc. SPIE. 7101, Advances in Optical Thin Films III

KEYWORDS: Thin films, Refractive index, Magnesium fluoride, Metals, Ions, Surface roughness, Deposition processes, Photometry, Fluorine, Absorption

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Proceedings Article | 5 October 2005 Paper

Properties of chirped mirrors manufactured by plasma ion assisted electron beam evaporation

Martin Bischoff, Olaf Stenzel, Dieter Gäbler, Norbert Kaiser

Proc. SPIE. 5963, Advances in Optical Thin Films II

KEYWORDS: Ultrafast phenomena, Refractive index, Mirrors, Electron beams, Error analysis, Ions, Reflectivity, Niobium, Tolerancing, Plasma

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