Dr. Martin Herms
at Fraunhofer IZFP
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 9 May 2005 Paper
Proc. SPIE. 5766, Testing, Reliability, and Application of Micro- and Nano-Material Systems III
KEYWORDS: Scattering, Nanoparticles, Particles, X-rays, Gallium arsenide, Raman spectroscopy, Phonons, Raman scattering, Cadmium sulfide, Selenium

Proceedings Article | 21 July 2004 Paper
Proc. SPIE. 5392, Testing, Reliability, and Application of Micro- and Nano-Material Systems II
KEYWORDS: Mirrors, Microscopy, X-rays, X-ray diffraction, Silicon, Nondestructive evaluation, Scanning electron microscopy, X-ray imaging, Acoustics, Semiconducting wafers

Proceedings Article | 29 March 2000 Paper
Proc. SPIE. 3945, Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V
KEYWORDS: Indium arsenide, Chemical species, Crystals, Gallium arsenide, Semiconductor lasers, Raman spectroscopy, Micro raman spectroscopy, Phonons, Raman scattering, Bismuth

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