Martin Landmann
at Fraunhofer IOF
SPIE Involvement:
Conference Program Committee | Author
Publications (10)

SPIE Journal Paper | 26 September 2020
OE Vol. 59 Issue 09

Proceedings Article | 19 May 2020 Presentation + Paper
Proc. SPIE. 11397, Dimensional Optical Metrology and Inspection for Practical Applications IX
KEYWORDS: Optical filters, Fringe analysis, Cameras, Sensors, 3D modeling, 3D metrology, Projection systems, Active sensors, Binary data, Device simulation

Proceedings Article | 17 September 2019 Paper
Proc. SPIE. 11144, Photonics and Education in Measurement Science 2019
KEYWORDS: Long wavelength infrared, Infrared cameras, Thermography, 3D acquisition, Cameras, Sensors, Calibration, 3D metrology, 3D image processing, Temperature metrology

Proceedings Article | 21 June 2019 Paper
Proc. SPIE. 11056, Optical Measurement Systems for Industrial Inspection XI
KEYWORDS: Thermography, Mid-IR, 3D image reconstruction, Cameras, 3D modeling, Quality measurement, 3D metrology, Gas lasers, Device simulation, 3D image processing

Proceedings Article | 13 May 2019 Paper
Proc. SPIE. 10991, Dimensional Optical Metrology and Inspection for Practical Applications VIII
KEYWORDS: Long wavelength infrared, Thermography, Imaging systems, Cameras, Sensors, Calibration, High speed cameras, 3D metrology, 3D image processing, Temperature metrology

Showing 5 of 10 publications
Conference Committee Involvement (3)
Dimensional Optical Metrology and Inspection for Practical Applications X
11 April 2021 | Orlando, Florida, United States
Dimensional Optical Metrology and Inspection for Practical Applications IX
27 April 2020 | Online Only, California, United States
Dimensional Optical Metrology and Inspection for Practical Applications VIII
16 April 2019 | Baltimore, Maryland, United States
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