Prof. Masamichi Fujihira
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 11 May 2009 Paper
Proceedings Volume 7379, 73790A (2009) https://doi.org/10.1117/12.824251
KEYWORDS: Chromium, Photomasks, Quartz, Surface roughness, Head-mounted displays, Scanning probe microscopy, Photoresist processing, Interfaces, Atomic force microscopy, Silicon

Proceedings Article | 6 September 1995 Paper
Kunio Nakajima, Yasuyuki Mitsuoka, Norio Chiba, Hiroshi Muramatsu, Tatsuaki Ataka, Masamichi Fujihira
Proceedings Volume 2535, (1995) https://doi.org/10.1117/12.218691
KEYWORDS: Near field optics, Near field scanning optical microscopy, Optical fibers, Photoresist materials, Optical signal processing, Image resolution, Near field, Silicon, Semiconducting wafers, Atomic force microscopy

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