Prof. Matiar M. R. Howlader
at McMaster Univ
SPIE Involvement:
Author
Publications (3)

SPIE Journal Paper | 1 October 2010
JM3, Vol. 9, Issue 04, 041107, (October 2010) https://doi.org/10.1117/12.10.1117/1.3500747
KEYWORDS: Interfaces, Silicon, Annealing, Semiconducting wafers, Plasma, Microelectromechanical systems, Reactive ion etching, Packaging, Oxides, Microfluidics

Proceedings Article | 21 September 2010 Paper
Jian Sun, Wanguo Liang, Yi Gan, Qingyang Xu, Chang-qing Xu, Matiar Howlader, Koji Nakamura, Tadashi Kishimoto
Proceedings Volume 7750, 77500M (2010) https://doi.org/10.1117/12.871851
KEYWORDS: Waveguides, Annealing, Refractive index, Diamond, Wave propagation, Hydrogen, Light wave propagation, Crystals, Semiconducting wafers, Photonics

Proceedings Article | 5 February 2010 Paper
Proceedings Volume 7592, 75920H (2010) https://doi.org/10.1117/12.845291
KEYWORDS: Reactive ion etching, Oxygen, Plasma, Annealing, Interfaces, Silicon, Surface roughness, Oxides, Packaging, Nitrogen

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top