Dr. Matthew E. Briggs Profile

Dr. Matthew E. Briggs

at Los Alamos National Lab

SPIE Involvement:

Author

Publications (4)

Proceedings Article | 13 September 2011 Paper

Design, assembly, and testing of a photon Doppler velocimetry probe

Robert Malone, Matthew Briggs, Brian Cata, Brian Cox, Edward Daykin, Douglas DeVore, David Esquibel, Daniel Frayer, Brent Frogget, Michael Furlanetto, Cenobio Gallegos, David Holtkamp, Morris Kaufman, Kevin McGillivray, Peter Pazuchanics, Lori Primas, Vincent Romero, Michael Shinas, Danny Sorenson

Proceedings Volume 8131, 813109 (2011) https://doi.org/10.1117/12.894461

KEYWORDS: Prisms, Lenses, Relays, Doppler effect, Velocimetry, Velocity measurements, Reflection, Fiber optics, Geometrical optics, Semiconducting wafers

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Proceedings Article | 21 September 2007 Paper

Design, construction, alignment, and calibration of a compact velocimetry experiment

Morris Kaufman, Robert Malone, Brent Frogget, David Esquibel, Vincent Romero, Gregory Lare, Bart Briggs, Adam Iverson, Daniel Frayer, Douglas DeVore, Brian Cata, David Holtkamp, Mark Wilke, Nick King, Michael Furlanetto, Matthew Briggs, Michael Furnish

Proceedings Volume 6676, 667607 (2007) https://doi.org/10.1117/12.732233

KEYWORDS: Diagnostics, Velocimetry, Interferometers, Velocity measurements, Mirrors, Calibration, Foam, Doppler effect, Pellicles, Relays

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Proceedings Article | 17 March 2005 Paper

Improved probe and analysis for VISAR

Matthew Briggs, Willard Hemsing, Michael Shinas, Gerald Whittemore

Proceedings Volume 5580, (2005) https://doi.org/10.1117/12.584280

KEYWORDS: Objectives, GRIN lenses, Calibration, Image processing, Gradient-index optics, Interferometers, Light, Interferometry, Velocity measurements, Doppler effect

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Proceedings Article | 4 November 1994 Paper

Photothermal deflection in a supercritical fluid

Matthew Briggs, Robert Gammon

Proceedings Volume 2253, (1994) https://doi.org/10.1117/12.192180

KEYWORDS: Absorption, Xenon, Calibration, Sapphire, Phase modulation, Quartz, Modulation, Laser beam diagnostics, Temperature metrology, Information operations

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