Dr. Matthew C. George
Applications Scientist
SPIE Involvement:
Author
Publications (12)

Proceedings Article | 13 March 2024 Presentation
Matthew George, Bradley Williams, Daniel Bacon-Brown, Ricky Edwards, Stuart Johnson, Rumyana Petrova, Stew Nielson
Proceedings Volume PC12897, PC128970Q (2024) https://doi.org/10.1117/12.3003756
KEYWORDS: Nanoimprint lithography, Metalenses, Manufacturing, Etching, Sodium, Semiconducting wafers, Nanofabrication, Modulation transfer functions, Metrology, Electron beam lithography

Proceedings Article | 13 March 2024 Presentation
Bradley Williams, Daniel Bacon-Brown, Matthew C. George, Rumyana Petrova, Adam Korb, Jamie Stocks
Proceedings Volume PC12898, PC128980U (2024) https://doi.org/10.1117/12.3008763
KEYWORDS: Nanoimprint lithography, Optical lithography, Manufacturing, Structural design, Semiconductors, Lithography, Infrared radiation, Industry, Industrial applications, Design and modelling

Proceedings Article | 13 March 2024 Presentation
Daniel Bacon-Brown, Matthew George, Rumyana Petrova, Stuart Johnson, Bradley Williams
Proceedings Volume PC12913, PC1291302 (2024) https://doi.org/10.1117/12.3008590
KEYWORDS: Metalenses, Industrial applications, Optical lithography, Nanoimprint lithography, Visible radiation, Semiconductor manufacturing, Manufacturing, Lithography, Design and modelling, Deep ultraviolet

Proceedings Article | 5 October 2023 Presentation
Bradley Williams, Daniel Bacon-Brown, Matthew George, Rumyana Petrova, Adam Korb, Jamie Stocks
Proceedings Volume PC12653, PC126530B (2023) https://doi.org/10.1117/12.2677387
KEYWORDS: Nanoimprint lithography, Manufacturing, Electron beam lithography, Optics manufacturing, Visible radiation, Semiconductor manufacturing, Metalenses, Lithography, High volume manufacturing, Deep ultraviolet

Proceedings Article | 15 March 2023 Presentation + Paper
Bradley Williams, Daniel Bacon-Brown, Ricky Edwards, Stew Nielson, Arash Farhang, Stuart Johnson, Rumyana Petrova, Matthew George, Shaun Ogden
Proceedings Volume 12432, 1243209 (2023) https://doi.org/10.1117/12.2649026
KEYWORDS: Metalenses, Nanoimprint lithography, Beam diameter, Niobium, Manufacturing, Metrology, Modulation transfer functions, Cameras, Sol gels, Design and modelling

Showing 5 of 12 publications
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top