Maksim A. Kleshchenok
SPIE Involvement:
Author
Publications (18)

Proceedings Article | 7 March 2019 Paper
Proc. SPIE. 11053, Tenth International Symposium on Precision Engineering Measurements and Instrumentation
KEYWORDS: Photodetectors, Error analysis, Signal processing, Raster graphics, Motion measurement, Temperature metrology

Proceedings Article | 7 March 2019 Paper
Proc. SPIE. 11053, Tenth International Symposium on Precision Engineering Measurements and Instrumentation
KEYWORDS: Optical components, Prisms, Retroreflectors, Sensors, Complex systems, Sensor networks, Infrared radiation, Algorithm development

Proceedings Article | 7 March 2019 Paper
Proc. SPIE. 11053, Tenth International Symposium on Precision Engineering Measurements and Instrumentation
KEYWORDS: Refractive index, Cameras, Error analysis, Digital cameras, Control systems, Image analysis, Image sensors, Active optics, Temperature metrology, RGB color model

Proceedings Article | 7 March 2019 Paper
Proc. SPIE. 11053, Tenth International Symposium on Precision Engineering Measurements and Instrumentation
KEYWORDS: Mathematical modeling, Optical fibers, Polarization, Tissues, Scattering, Light scattering, Polarizers, Polarimetry, Tissue optics, Anisotropy

Proceedings Article | 26 June 2017 Paper
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Photodetectors, Optical filters, Light emitting diodes, Cameras, Video, Error analysis, Receivers, Control systems, Optical flow, Infrared radiation, Convection, Atmospheric propagation, Temperature metrology

Showing 5 of 18 publications
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top