Prof. Meifa Huang
at Guilin Univ of Electronic Technology
SPIE Involvement:
Author
Publications (8)

SPIE Journal Paper | 6 September 2012
Hui Jing, Cong Li, Bing Kuang, Meifa Huang, Yanru Zhong
OE, Vol. 51, Issue 9, 093601, (September 2012) https://doi.org/10.1117/12.10.1117/1.OE.51.9.093601
KEYWORDS: Computer simulations, Monte Carlo methods, Statistical analysis, Optical engineering, Temperature metrology, Lithium, Reliability, Electrical engineering, Visualization, Aerospace engineering

Proceedings Article | 31 December 2008 Paper
Yan-ru Zhong, Yu-jin Zhao, De-wei Guo, Mei-fa Huang
Proceedings Volume 7130, 71305C (2008) https://doi.org/10.1117/12.819752
KEYWORDS: Radium, Standards development, Surface roughness, Inspection, Global Positioning System, Microscopes, Control systems, Electrical engineering, Precision measurement, Fluctuations and noise

Proceedings Article | 12 March 2008 Paper
Hui Jing, Mei-fa Huang, Yan-ru Zhong, Bing Kuang, Xiang-qian Jiang
Proceedings Volume 6624, 66240Q (2008) https://doi.org/10.1117/12.791087
KEYWORDS: Monte Carlo methods, Optical testing, Statistical analysis, Computer simulations, Probability theory, Reliability, Imaging systems, Electrical engineering, Control systems, Computer engineering

Proceedings Article | 28 November 2007 Paper
Meifa Huang, Hui Jing, Yanru Zhong, Bing Kuang
Proceedings Volume 6833, 683309 (2007) https://doi.org/10.1117/12.755925
KEYWORDS: 3D modeling, Data modeling, Neurons, Databases, Feature extraction, Performance modeling, Visual process modeling, Statistical modeling, Solid modeling, Computer graphics

Proceedings Article | 6 November 2006 Paper
Yonghou Sun, Ya Zhang, Meifa Huang, Yanru Zhong
Proceedings Volume 6357, 635737 (2006) https://doi.org/10.1117/12.717171
KEYWORDS: Global Positioning System, Standards development, 3D modeling, 3D metrology, Metrology, Manufacturing, Reliability, Rule based systems, Tolerancing, Calibration

Showing 5 of 8 publications
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