Michael K. Kalms
Scientist at Bremer Institut fuer angewandte Strahltechnik GmbH
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Author
Publications (28)

Proceedings Article | 3 September 2019 Paper
Proc. SPIE. 11102, Applied Optical Metrology III
KEYWORDS: Diamond turning, Reflection, Imaging systems, Scattering, Cameras, Manufacturing, Deflectometry, Surface properties, Phase measurement, Surface finishing

Proceedings Article | 1 April 2019 Paper
Proc. SPIE. 10971, Nondestructive Characterization and Monitoring of Advanced Materials, Aerospace, Civil Infrastructure, and Transportation XIII
KEYWORDS: Visualization, Cameras, Metals, Clouds, Data acquisition, Additive manufacturing, Optical metrology, 3D metrology, Dimensional metrology, Structured light

Proceedings Article | 4 September 2018 Presentation + Paper
Proc. SPIE. 10750, Reflection, Scattering, and Diffraction from Surfaces VI
KEYWORDS: Metrology, Visual process modeling, Imaging systems, Cameras, Calibration, CCD cameras, Optical metrology, Optical calibration, Precision calibration

Proceedings Article | 24 May 2018 Presentation + Paper
Proc. SPIE. 10678, Optical Micro- and Nanometrology VII
KEYWORDS: Displays, Visual process modeling, Reflection, Cameras, Calibration, Deflectometry, Refraction, Phase measurement, Model-based design, Device simulation

Proceedings Article | 27 March 2018 Paper
Proc. SPIE. 10599, Nondestructive Characterization and Monitoring of Advanced Materials, Aerospace, Civil Infrastructure, and Transportation XII
KEYWORDS: Digital signal processing, Modulation, Materials processing, Physics, Clouds, Analytical research, Electrical engineering, All optical signal processing, Americium, Tin

Showing 5 of 28 publications
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