Dr. Michael E. Levinshtein
at Ioffe Institute
SPIE Involvement:
Publications (4)

Proceedings Article | 22 June 2007 Paper
Proc. SPIE. 6600, Noise and Fluctuations in Circuits, Devices, and Materials
KEYWORDS: Semiconductors, Data modeling, Diffusion, Doping, Diodes, Transistors, Silicon carbide, Resistors, Microwave radiation, Systems modeling

Proceedings Article | 25 May 2004 Paper
Proc. SPIE. 5470, Noise in Devices and Circuits II
KEYWORDS: Oscillators, Etching, Silicon, Resistance, Telecommunications, Optical communications, Diodes, Transistors, Silicon carbide, Microwave radiation

Proceedings Article | 11 June 2003 Paper
Proc. SPIE. 5023, 10th International Symposium on Nanostructures: Physics and Technology
KEYWORDS: Semiconductors, Silicon, Gallium nitride, Transistors, Field effect transistors, Metalorganic chemical vapor deposition, Microwave radiation, Semiconducting wafers, Heterojunctions, Information operations

Proceedings Article | 12 May 2003 Paper
Proc. SPIE. 5113, Noise in Devices and Circuits
KEYWORDS: Thin films, Photodetectors, Silicon, Gallium nitride, Diodes, Aluminum, Field effect transistors, Gallium, Heterojunctions, Temperature metrology

Proceedings Volume Editor (2)

SPIE Conference Volume | 25 May 2004

SPIE Conference Volume | 12 May 2003

Conference Committee Involvement (2)
Noise in Devices and Circuits II
26 May 2004 | Maspalomas, Gran Canaria Island, Spain
Noise in Devices and Circuits
2 June 2003 | Santa Fe, New Mexico, United States
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