Dr. Michael Linder Profile

Dr. Michael Linder

Sr. Manager Commercial Technology EMEA at Corning GmbH

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Publications (1)

Proceedings Article | 1 July 2002 Paper

Ultrahigh-accuracy measurement of the coefficient of thermal expansion for ultralow expansion materials

Vivek Badami, Michael Linder

Proceedings Volume 4688, (2002) https://doi.org/10.1117/12.472323

KEYWORDS: Temperature metrology, Interferometers, Metrology, Error analysis, Thermography, Fabry–Perot interferometers, Optical coatings, Reflectivity, Statistical analysis, Refractive index

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