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Ultra-low landing energy scanning electron microscopy for nanoengineering applications and metrology
The National Institute of Standards and Technology (NIST) has engaged with the International Ultra Violet Association (IUVA) and its member companies and affiliates to explore ways to develop needed standards, determine appropriate testing protocols, and transfer the technology to help to reduce these inharmonious market conditions. Collaborative efforts are underway to develop science-based answers to the healthcare industry’s questions surrounding standards and measures of device disinfection efficacy, as well as reliability, operations and durability. These issues were recently discussed at the IUVA 2018 America’s Conference in Redondo Beach, CA in several panel sessions. A major output of the sessions was the formation of a formal IUVA Working Group for the development of antimicrobial standards and initiatives for the healthcare industry. The goal of this working group is to provide global guidance, with specific programs and deliverables, on the use of UV technologies and standards to combat HAIs and to further the stated aims of the IUVA on its outreach to the healthcare industry. This paper reviews the strong collaboration between NIST and its industry partners pursuing the development of standards, guidelines and guidance documents related to healthcare applications that include standard methods for validating performance of UV devices and test guidelines for efficacy measurements. In addition, an overview of the issues, problems, and a summary of the needs confronting future growth and success of the UV industry in the Nation’s healthcare application space is provided.
This will count as one of your downloads.
You will have access to both the presentation and article (if available).
The scanning electron microscope (SEM) is used extensively in semiconductor production as a measurement tool for inspection and critical dimension (CD) metrology. Improved images and measurements can be obtained and interpreted better by studying the details of the image-formation process. Non-mathematical explanations of the basic principles will allow the participant to get the best possible information from the specimen. There is also a discussion of how to get the most accurate measurements with this instrument.
This one day short course will be devoted to the use of scanning microscopies including scanning electron microscopy (SEM), scanning optical profilometry, and energy dispersive x-ray (EDS) and x-ray fluorescence (XRF) spectrometry to forensic sample analyses including counter terrorism, explosives, pyrotechnics, counterfeit drugs and food and product tampering. The course is presented in four sections. Section one will provide the students with an understanding of the value and pitfalls of relying on instrument software in the examination of varying samples types and analysis conditions. Emphasis will be place on issues of instrument quality assurance including calibration, operation and understanding your instrument's data and compliance with certification organizations including ISO and ASCLD/LAB. Section two will be devoted to a presentation of sample handling and preparation as well as "unknown white powder" case analyses and other cases involving counterfeit drugs, food and product tampering. Section three will cover the issues of gunshot residue (GSR) analysis and more "unknown white powder" analyses related to pyrotechnic devices and flares as well as a presentation on improvised acid/foil bombs. Section four will include additional approaches to the analyses of "unknown white powder" cases so common today, the capabilities of a forensic laboratory in supporting emergency responders, and a number of illustrative case histories. Additional topics may cover a Scientific Working Group on Gun Shot Residue (SWGGSR) update report and perspective on instant shooter GSR kits. This course will be jointly presented by four instructors, all recognized experts in their respective area of scanning microscopy and applications to forensic science.
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