Michael A. Soel
Technical Director, Systems & Technology at FLIR Systems, Inc.
SPIE Involvement:
Conference Program Committee | Author
Publications (7)

Proceedings Article | 14 May 2019 Paper
Proc. SPIE. 11001, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXX
KEYWORDS: Infrared imaging, Imaging systems, Sensors, Sensor performance, Analytical research, Systems engineering, Performance modeling, Thermal modeling, Electro optical modeling, Systems modeling

SPIE Journal Paper | 1 August 2003
OE Vol. 42 Issue 08
KEYWORDS: Sensors, Optical filters, Black bodies, Image segmentation, Mid-IR, Atmospheric optics, Signal to noise ratio, Image filtering, Imaging systems, Target detection

Proceedings Article | 29 July 2002 Paper
Proc. SPIE. 4719, Infrared and Passive Millimeter-wave Imaging Systems: Design, Analysis, Modeling, and Testing
KEYWORDS: Infrared cameras, Thermography, Infrared sensors, Infrared imaging, Imaging systems, Sensors, Image sensors, Modulation transfer functions, Forward looking infrared, Minimum resolvable temperature difference

Proceedings Article | 29 July 2002 Paper
Proc. SPIE. 4719, Infrared and Passive Millimeter-wave Imaging Systems: Design, Analysis, Modeling, and Testing
KEYWORDS: Target detection, Infrared sensors, Sensors, Surveillance, Image sensors, Medium wave, Atmospheric sensing, Sensor technology, Atmospheric modeling, Quantum well infrared photodetectors

Proceedings Article | 29 July 2002 Paper
Proc. SPIE. 4719, Infrared and Passive Millimeter-wave Imaging Systems: Design, Analysis, Modeling, and Testing
KEYWORDS: Signal to noise ratio, Infrared sensors, Mid-IR, Optical filters, Imaging systems, Sensors, Calibration, Image segmentation, Black bodies, Atmospheric optics

Showing 5 of 7 publications
Conference Committee Involvement (18)
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXXII
12 April 2021 | Online Only, Florida, United States
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXXI
27 April 2020 | Online Only, California, United States
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXX
16 April 2019 | Baltimore, Maryland, United States
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIX
17 April 2018 | Orlando, Florida, United States
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVIII
11 April 2017 | Anaheim, California, United States
Showing 5 of 18 Conference Committees
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