Michel J. E. Van de Moosdijk
Sr. Application Engineer at ASML Netherlands BV
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Publications (2)

Proceedings Article | 10 December 2009 Paper
Proceedings Volume 7520, 75200A (2009) https://doi.org/10.1117/12.837171
KEYWORDS: Silicon, Gold, Semiconducting wafers, Maskless lithography, Optical lithography, Flexible circuits, Transistors, Lithography, Critical dimension metrology, Electrodes

Proceedings Article | 1 July 2002 Paper
Michael Van de Moosdijk, Ennos Van den Brink, Klaus Simon, Alexander Friz, Geoffrey Phillipps, Richard Travers, Erik Raaymakers
Proceedings Volume 4688, (2002) https://doi.org/10.1117/12.472358
KEYWORDS: Semiconducting wafers, Head, Metrology, Reticles, Calibration, Distortion, Deep ultraviolet, Magnetism, Lithography, Interferometers

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