Michel Vuillermet
Deputy Technical Director at LYNRED
SPIE Involvement:
Author
Publications (25)

Proceedings Article | 30 July 2014 Paper
Proc. SPIE. 9146, Optical and Infrared Interferometry IV
KEYWORDS: Infrared cameras, Near infrared, Telescopes, Avalanche photodetectors, Stars, Polarization, Interferometers, Cameras, Sensors, Interferometry

Proceedings Article | 24 October 2012 Paper
Proc. SPIE. 8541, Electro-Optical and Infrared Systems: Technology and Applications IX
KEYWORDS: Staring arrays, Infrared detectors, Avalanche photodetectors, Sensors, Manufacturing, Photodiodes, Diodes, Epitaxy, Infrared technology, Temperature metrology

Proceedings Article | 13 September 2012 Paper
Proc. SPIE. 8447, Adaptive Optics Systems III
KEYWORDS: CMOS sensors, Avalanche photodetectors, Imaging systems, Cameras, Sensors, Quantum efficiency, Wavefront sensors, Adaptive optics, Infrared radiation, Charge-coupled devices

Proceedings Article | 31 May 2012 Paper
Proc. SPIE. 8353, Infrared Technology and Applications XXXVIII
KEYWORDS: Staring arrays, Infrared detectors, Avalanche photodetectors, Liquid phase epitaxy, Sensors, Manufacturing, Photodiodes, Diodes, Epitaxy, Temperature metrology

Proceedings Article | 21 May 2011 Paper
Proc. SPIE. 8012, Infrared Technology and Applications XXXVII
KEYWORDS: Staring arrays, Infrared detectors, Mercury cadmium telluride, Sensors, Reliability, Interference (communication), Diodes, CMOS technology, Medium wave, Temperature metrology

Showing 5 of 25 publications
Conference Committee Involvement (6)
Infrared Technology and Applications XLIII
9 April 2017 | Anaheim, California, United States
Infrared Technology and Applications XLII
18 April 2016 | Baltimore, Maryland, United States
Infrared Technology and Applications XLI
20 April 2015 | Baltimore, Maryland, United States
Infrared Technology and Applications XL
5 May 2014 | Baltimore, Maryland, United States
Infrared Technology and Applications XXXIX
29 April 2013 | Baltimore, Maryland, United States
Showing 5 of 6 Conference Committees
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