Prof. Mikhail Ya. Valakh Profile

Prof. Mikhail Ya. Valakh

Deputy Director at Institute of Semiconductor Physics

SPIE Involvement:

Author

Proceedings Article | 11 June 2003 Paper

Room-temperature photoluminescence of GeSi/Si(001) self-assembled islands in a 1.3-1.7 um wavelength range

Yu. Drozdov, Z. Krasil'nik, D. Lobanov, A. Novikov, Mikhail Valakh, N. Vostokov, A. Yablonsky, V. Yukhymchuk

Proceedings Volume 5023, (2003) https://doi.org/10.1117/12.513596

KEYWORDS: Germanium, Silicon, Luminescence, Atomic force microscopy, Raman spectroscopy, Sensors, X-rays, Physics, X-ray diffraction, Spectroscopy

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Proceedings Article | 11 June 2003 Paper

High-efficient up-conversion of photoluminescence in CdSe/ZnSe nanostructures

V. Strelchuk, Mikhail Valakh, M. Vuychik, S. Ivanov, Petr Kop'ev, T. Shubina

Proceedings Volume 5023, (2003) https://doi.org/10.1117/12.511505

KEYWORDS: Luminescence, Nanostructures, Absorption, Semiconductors, Heterojunctions, Quantum wells, Excitons, Quantum dots, Interfaces, Cadmium

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Proceedings Article | 1 April 2003 Paper

Optical diagnostics of InGaAs quantum well in pseudomorphic modulation-doped Al1-xGaxAs/InyGa1-yAs/GaAs heterostructures of less-than-critical layer thickness

Georgiy Tarasov, S. Lavorik, Yu. Mazur, Mikhail Valakh, Z. Zhuchenko, H. Kissel, W. Masselink, U. Mueller, C. Walther

Proceedings Volume 5024, (2003) https://doi.org/10.1117/12.497184

KEYWORDS: Quantum wells, Raman spectroscopy, Indium gallium arsenide, Phonons, Heterojunctions, Raman scattering, Gallium arsenide, Modulation, Magnetism, Acoustics

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Proceedings Article | 20 April 1998 Paper

Diagnostics of nitrogen-implanted diamond-like carbon films by optical and microhardness measurements

Victor Artamonov, Nickolai Klyui, B. Romanyuk, Mikhail Valakh, O. Vasylyk, Victor Semenovich, Alejandro Perez-Rodriguez, Juan Morante

Proceedings Volume 3359, (1998) https://doi.org/10.1117/12.306239

KEYWORDS: Nitrogen, Raman spectroscopy, Carbon, Ions, Ion beams, Ion implantation, Luminescence, Diagnostics, Optical testing, Crystals

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Proceedings Article | 20 April 1998 Paper

Optical diagnostics of light-emitting Si clusters in SiO2 formed by ion implantation

Mikhail Valakh, V. Yukhimchuk, V. Bratus', A. Nasarov, Peter Hemment, T. Komoda

Proceedings Volume 3359, (1998) https://doi.org/10.1117/12.306228

KEYWORDS: Silicon, Nanocrystals, Annealing, Remote sensing, Silica, Plasma treatment, Ion implantation, Ions, Nitrogen, Hydrogen

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Proceedings Article | 20 April 1998 Paper

Raman-scattering diagnostics of the structure of hydrogenated amorphous diamond-like carbon films

Mikhail Valakh, O. Vasylyk, A. Gontar, A. Kutsay

Proceedings Volume 3359, (1998) https://doi.org/10.1117/12.306245

KEYWORDS: Carbon, Raman spectroscopy, Hydrogen, Plasma, Ions, Diagnostics, Methane, Diamond, Spectroscopy, Raman scattering

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Proceedings Article | 3 November 1995 Paper

Optical properties of submicron filament silicon crystals

Y. Gule, Alla Klimovskaya, Galina Rudko, Mikhail Valakh, I. Ostrovskii, G. Tsebulya

Proceedings Volume 2648, (1995) https://doi.org/10.1117/12.226199

KEYWORDS: Crystals, Silicon, Scattering, Light scattering, Absorption, Anisotropy, Luminescence, Visible radiation, Particles, Mie scattering

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Proceedings Article | 3 November 1995 Paper

Photoluminescent and infrared Fourier diagnostics of porous silicon exposed to HF destructive etching

Galina Rudko, Tamara Gorbach, Petr Smertenko, Sergey Svechnikov, Mikhail Valakh, Vladimir Bondarenko, Alexandr Dorofeev

Proceedings Volume 2648, (1995) https://doi.org/10.1117/12.226185

KEYWORDS: Silicon, FT-IR spectroscopy, Etching, Luminescence, Oxygen, Diagnostics, HF etching, Hydrogen, Oxides, Infrared photography

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Proceedings Article | 23 October 1995 Paper

Micro-Raman characterization of SiC polytype natural heterostructures

Victor Artamonov, Alexei Pogorelov, Marion Renucci, Mikhail Valakh

Proceedings Volume 2543, (1995) https://doi.org/10.1117/12.225295

KEYWORDS: Silicon carbide, Remote sensing, Raman spectroscopy, Phonons, Luminescence, X-ray diffraction, Raman scattering, Heterojunctions, Diffraction, Interfaces

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SPIE Journal Paper | 1 April 1995

Effect of polarization self-action in cubic crystals: peculiarities and applications

Sergei Boiko, Mikhail Lisitsa, Georgiy Tarasov, Mikhail Valakh

OE, Vol. 34, Issue 04, (April 1995) https://doi.org/10.1117/12.10.1117/12.197142

KEYWORDS: Crystals, Polarization, Absorption, Nonlinear crystals, Nonlinear optics, Anisotropy, Modulation, Laser crystals, Complex systems, Lab on a chip

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Proceedings Article | 31 October 1994 Paper

Photoluminescence characterization of silicon subjected to various industrial treatments

Mikhail Valakh, Galina Rudko, N. Shakhraychuk

Proceedings Volume 2113, (1994) https://doi.org/10.1117/12.191971

KEYWORDS: Luminescence, Annealing, Silicon, Phosphorus, Excitons, Germanium, Boron, Doping, Ions, Process control

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Showing 5 of 11 publications

SPIE Conference Volume | 1 April 2003

Selected Papers on Optics and Photonics: Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics

SPIE Conference Volume | 20 April 1998

Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997

SPIE Conference Volume | 3 November 1995

International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics

SPIE Conference Volume | 31 October 1994

Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics

Conference Committee Involvement (6)

Selected Papers on Optics and Photonics: Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics

1 April 2003 | Moscow, Russian Federation

International Conference on Optical Diagnosis of Materials and Devices for Opto-, Micro-, and Quantum Electronics

13 May 1997 | Kiev, Ukraine

International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics

13 May 1997 | Kiev, Ukraine

Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics

11 May 1995 | Kiev, Ukraine

International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics

11 May 1995 | Kiev, Ukraine

Showing 5 of 6 Conference Committees

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