Mr. Mohammad Reza Jafarfard Profile

Mohammad Reza Jafarfard

at Yonsei Univ

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Author

Publications (6)

Proceedings Article | 13 March 2015 Paper

Optical unwrapping by triple illumination interferometer

Behnam Tayebi, Mohammad Reza Jafarfard, Farnaz Sharif, Young Sik Song, Dug Young Kim

Proceedings Volume 9369, 93690W (2015) https://doi.org/10.1117/12.2079536

KEYWORDS: Interferometers, Phase interferometry, Cameras, Phase shift keying, Spatial frequencies, Phase imaging, Physics, Singular optics, Refractive index, Real time imaging

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Proceedings Article | 10 March 2015 Paper

Reduction of phase volume error in off-axis quantitative phase microscopy using optimum phase-shift

Mohammad Reza Jafarfard, Behnam Tayebi, Razie Jalali Nasab, Dug Young Kim

Proceedings Volume 9386, 93860P (2015) https://doi.org/10.1117/12.2078681

KEYWORDS: Bandpass filters, Phase measurement, Refractive index, Spatial frequencies, Fourier transforms, Microscopy, Charge-coupled devices, Error analysis, Linear filtering, Liquids

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Proceedings Article | 11 November 2014 Paper

Dispersion measurement of optical fiber using dual wavelength diffraction phase microscope

Mohammad Reza Jafarfard, Behnam Tayebi, Razie Jalai Nasab, Dug Young Kim

Proceedings Volume 9271, 927119 (2014) https://doi.org/10.1117/12.2074436

KEYWORDS: Microscopes, Diffraction, Optical fibers, Diffraction gratings, Optical testing, Refractive index, Solids, Spatial filters, Physics, Microscopy

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Proceedings Article | 11 November 2014 Paper

Effect of the angle accuracy in reduced-phase dual-illumination interferometer

Behnam Tayebi, Mohammad Reza Jafarfard, Farnaz Sharif, Dug Young Kim

Proceedings Volume 9271, 92711V (2014) https://doi.org/10.1117/12.2074457

KEYWORDS: Interferometers, Phase shift keying, Phase imaging, Charge-coupled devices, Spatial frequencies, Fourier transforms, Speckle, Physics, Reconstruction algorithms, 3D image reconstruction

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Proceedings Article | 18 August 2014 Paper

Transparent stepped phase measurement using two illuminating beams

Behnam Tayebi, Farnaz Sharif, Mohammad Reza Jafar Fard‎, Dug Young Kim

Proceedings Volume 9203, 920306 (2014) https://doi.org/10.1117/12.2061619

KEYWORDS: Phase measurement, Phase imaging, Refractive index, Microscopes, Speckle, Charge-coupled devices, Phase shift keying, Spatial frequencies, Laser sources, Light sources

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Proceedings Article | 18 August 2014 Paper

Dual-wavelength diffraction phase microscopy for real-time dispersion measurement

Mohammad Reza Jafarfard, Behnam Tayebi, Dug Young Kim

Proceedings Volume 9203, 92030T (2014) https://doi.org/10.1117/12.2061225

KEYWORDS: Diffraction, Microscopy, Diffraction gratings, Microscopes, Spatial filters, Optical filters, Interferometers, Image sensors, Signal processing, Physics

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Showing 5 of 6 publications

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