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Moo Youn Park
Senior Engineer at SAMSUNG Electro-Mechanics
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Publications (4)
Proceedings Article | 13 February 2007 Paper
A novel temperature compensated operation scheme for trichromatic LED backlights
Dong-Woo Lee, Jin-Ha Kim, Moo-Youn Park, Hee-Dong Kim, Jae-Kyuk Park, Soo-Ryong Hwang, Sung-Min Cho
Proceedings Volume 6486, 648612 (2007) https://doi.org/10.1117/12.710757
KEYWORDS: Light emitting diodes, LED backlight, Resistance, LCDs, Temperature metrology, Transmittance, Photography, Blue light emitting diodes, Field effect transistors, Green light emitting diodes
Proceedings Article | 22 February 2006 Paper
High-efficiency trichromatic LED backlight for mobile LCDs
Jin-Ha Kim, Moo Youn Park, Jin-Jong Kim, Heedong Kim, Joo-Hee Jun, Jae-Hyuk Park, Sung-Min Cho, Dong-Woo Lee, Soo Ryong Hwang, Ho-Seop Jeong
Proceedings Volume 6134, 613409 (2006) https://doi.org/10.1117/12.659200
KEYWORDS: Light emitting diodes, LED backlight, LCDs, RGB color model, Transmittance, Temperature metrology, Optical filters, Blue light emitting diodes, Green light emitting diodes, Televisions
Proceedings Article | 24 January 2004 Paper
Packaging considerations for reliability of electrically controlled MEMS VOA
Yeong Gyu Lee, Seok Kee Hong, Moo Youn Park, Sung Cheon Jung, Seong Hun Lee
Proceedings Volume 5346, (2004) https://doi.org/10.1117/12.524603
KEYWORDS: Microelectromechanical systems, Packaging, Reliability, Optical fibers, Epoxies, Actuators, Optical components, Optical alignment, Camera shutters, Signal attenuation
Proceedings Article | 23 December 2003 Paper
Investigation of improving MEMS-type VOA reliability
Seok Hong, Yeong Lee, Moo Park
Proceedings Volume 5343, (2003) https://doi.org/10.1117/12.524609
KEYWORDS: Reliability, Microelectromechanical systems, Failure analysis, Optical communications, Control systems, Camera shutters, Humidity, Atrial fibrillation, Statistical analysis, Optical fibers
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