Motohiro Tanaka
at Hitachi High-Tech America Inc
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 30 April 2023 Poster
Proceedings Volume PC12499, PC124990I (2023) https://doi.org/10.1117/12.2656040
KEYWORDS: Etching, Dielectrics, Gallium arsenide, Reactive ion etching, Manufacturing, Transistors, Plasma etching, Plasma, Magnetism, Ions

Proceedings Article | 5 April 2012 Paper
Proceedings Volume 8324, 83242H (2012) https://doi.org/10.1117/12.917962
KEYWORDS: Image enhancement, Etching, Line width roughness, Line edge roughness, Scanning electron microscopy, Semiconductors, Critical dimension metrology, Metrology, Image quality, Semiconducting wafers

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