CONFERENCE PROCEEDINGS
Advanced Search
Munenori Fukunishi
at Olympus America Inc
SPIE Involvement:
Author
Publications (3)
Proceedings Article | 27 February 2015 Paper
Automatically designing an image processing pipeline for a five-band camera prototype using the local, linear, learned (L3) method
Qiyuan Tian, Henryk Blasinski, Steven Lansel, Haomiao Jiang, Munenori Fukunishi, Joyce Farrell, Brian Wandell
Proceedings Volume 9404, 940403 (2015) https://doi.org/10.1117/12.2083435
KEYWORDS: Cameras, Sensors, Image processing, Transform theory, Prototyping, Image sensors, Calibration, Device simulation, Data modeling, Video acceleration
Proceedings Article | 24 May 2004 Paper
Robust and efficient image processing scheme for electron beam LSI wafer pattern inspection
Proceedings Volume 5375, (2004) https://doi.org/10.1117/12.534662
KEYWORDS: Inspection, Semiconducting wafers, Image processing, Defect detection, Electron beams, Image analysis, Wafer inspection, Defect inspection, Scanning electron microscopy, Imaging systems
Proceedings Article | 15 July 2003 Paper
In-line e-beam inspection with optimized sampling and newly developed ADC
Masami Ikota, Akihiro Miura, Munenori Fukunishi, Takashi Hiroi, Aritoshi Sugimoto
Proceedings Volume 5041, (2003) https://doi.org/10.1117/12.485225
KEYWORDS: Inspection, Particles, Defect inspection, Defect detection, Optical inspection, Semiconducting wafers, Image classification, Manufacturing, Electron beams, Product engineering
SIGN IN TO:
  • View contact details
UPDATE YOUR PROFILE
Is this your profile? Update it now.
Sign into your SPIE.org account
Don’t have a profile and want one?
Create an account on SPIE.org
Advertisement
Advertisement
Back to Top