Myung Soon Kim
at Korea Research Institute of Standard and Science
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 13 May 2013 Paper
Proc. SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII
KEYWORDS: Optical microscopes, Imaging systems, Interferometers, Calibration, Digital cameras, Computer programming, CCD cameras, Tablets, Distance measurement, Aluminum

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