Prof. Nagahisa Ogasawara Profile

Prof. Nagahisa Ogasawara

Professor at National Defense Academy

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Publications (5)

Proceedings Article | 5 May 2017 Paper

Infrared image correction for the reduction of background reflection

N. Ogasawara, C. Kobayashi, H. Yamada

Proc. SPIE. 10214, Thermosense: Thermal Infrared Applications XXXIX

KEYWORDS: Thermography, Infrared imaging, Refractive index, Reflection, Image processing, Dielectrics, Reflectivity, Buildings, Infrared radiation, Temperature metrology

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Proceedings Article | 12 May 2015 Paper

Evaluation of angle dependence in spectral emissivity of ceramic tiles measured by FT-IR

C. Kobayashi, N. Ogasawara, H. Yamada, S. Yamada, T. Kikuchi

Proc. SPIE. 9485, Thermosense: Thermal Infrared Applications XXXVII

KEYWORDS: Thermography, Infrared imaging, Refractive index, FT-IR spectroscopy, Ceramics, Inspection, Black bodies, Infrared radiation, Radium, Temperature metrology

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Proceedings Article | 12 May 2015 Paper

Active infrared thermographic testing with distance heating

N. Ogasawara, H. Ando, C. Kobayashi, H. Yamada

Proc. SPIE. 9485, Thermosense: Thermal Infrared Applications XXXVII

KEYWORDS: Thermography, Near infrared, Energy efficiency, Quartz, Tungsten, Coating, Black bodies, Far infrared, Infrared radiation, Halogens

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Proceedings Article | 10 May 2011 Paper

Thinning identification technique using stainless steel film heater and response surface method

Nagahisa Ogasawara, Hiroyuki Yamada

Proc. SPIE. 8013, Thermosense: Thermal Infrared Applications XXXIII

KEYWORDS: Infrared cameras, Thermography, Cameras, Metals, Resistance, Inspection, Nondestructive evaluation, Infrared radiation, Thermal imaging cameras, Temperature metrology

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Proceedings Article | 4 April 1997 Paper

Application of infrared thermography to fracture mechanics

Nagahisa Ogasawara, Masaki Shiratori

Proc. SPIE. 3056, Thermosense XIX: An International Conference on Thermal Sensing and Imaging Diagnostic Applications

KEYWORDS: Thermography, Mechanics, Image processing, Computing systems, Nondestructive evaluation, Televisions, Finite element methods, Measurement devices, Infrared radiation, Temperature metrology

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