Dr. Nagaraja P. Rao
Research Scientist at Real Time Metrology
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 25 March 2008 Paper
Nagaraja Rao, Patrick Kinney, Anand Gupta
Proceedings Volume 6922, 69223B (2008) https://doi.org/10.1117/12.772384
KEYWORDS: Semiconducting wafers, Particles, Nanoimprint lithography, Inspection, Image filtering, Silicon, Wafer inspection, Wafer testing, Metrology, Image processing

Proceedings Article | 18 September 1997 Paper
C. R. Rao, Jianhua Chen, Jerry Sullivan, Nian Zhang, Weihe Wang
Proceedings Volume 3117, (1997) https://doi.org/10.1117/12.283816
KEYWORDS: Calibration, Satellites, Sensors, Atmospheric modeling, Radiometry, Space operations, Visible radiation, Reflection, Meteorological satellites, Atmospheric particles

Proceedings Article | 11 November 1996 Paper
C. R. Rao, Jianhua Chen, Nian Zhang
Proceedings Volume 2820, (1996) https://doi.org/10.1117/12.258094
KEYWORDS: Calibration, Atmospheric particles, Atmospheric modeling, Satellites, Aerosols, Radiometry, Reflection, Analytical research, Solar radiation, Atmospheric optics

Proceedings Article | 15 November 1993 Paper
C. R. Nagaraja Rao, Jianhua Chen
Proceedings Volume 1938, (1993) https://doi.org/10.1117/12.161571
KEYWORDS: Calibration, Radiometry, Satellites, Space operations, Algorithm development, Reflectivity, Clouds, Climatology

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top