Dr. Nan Gao
Optical Engineer at Hebei Univ of Technology
SPIE Involvement:
Author
Publications (16)

SPIE Journal Paper | 17 February 2021
OE Vol. 60 Issue 02

Proceedings Article | 10 October 2020 Presentation + Paper
Proc. SPIE. 11552, Optical Metrology and Inspection for Industrial Applications VII
KEYWORDS: 3D metrology, Deflectometry, Imaging systems, 3D acquisition, Infrared imaging, Light, Complex systems, Reflectivity, Data processing, Reflection

Proceedings Article | 10 October 2020 Presentation
Proc. SPIE. 11551, Holography, Diffractive Optics, and Applications X
KEYWORDS: 3D metrology, Imaging systems, 3D acquisition, Infrared imaging, Light, Complex systems, Reflectivity, Deflectometry, Data processing, Data integration

Proceedings Article | 10 October 2020 Presentation
Proc. SPIE. 11552, Optical Metrology and Inspection for Industrial Applications VII
KEYWORDS: Cameras, Error analysis, Calibration, 3D acquisition, Feature extraction, Image compression, Device simulation

Proceedings Article | 18 December 2019 Paper
Proc. SPIE. 11338, AOPC 2019: Optical Sensing and Imaging Technology
KEYWORDS: Mirrors, Infrared cameras, Fringe analysis, Glasses, 3D metrology, Cameras, Calibration, Infrared radiation, Projection systems, Deflectometry

Showing 5 of 16 publications
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