Dr. Nandigana Krishna Mohan Profile

Dr. Nandigana Krishna Mohan

Senior Scientific Officer Gr.1 at Indian Institute of Technology Madras

SPIE Involvement:

Author

Publications (33)

Proceedings Article | 17 July 2015 Paper

White light single-shot interferometry with colour CCD camera for optical inspection of microsystems

Paul Kumar Upputuri, Manojit Pramanik, Krishna Mohan Nandigana, Mahendra Prasad Kothiyal

Proc. SPIE. 9524, International Conference on Optical and Photonic Engineering (icOPEN 2015)

KEYWORDS: Fringe analysis, Microsystems, Interferometers, Reflectivity, Interferometry, CCD cameras, Profiling, Optical interferometry, Charge-coupled devices, Phase shifts

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Proceedings Article | 4 March 2015 Paper

White light interferometer with color CCD for 3D-surface profiling of microsystems

Paul Upputuri, Manojit Pramanik, Krishna Nandigana, Mahendra Kothiyal

Proc. SPIE. 9302, International Conference on Experimental Mechanics 2014

KEYWORDS: Fringe analysis, Microsystems, Interferometers, CCD cameras, Profiling, 3D metrology, Optical interferometry, Charge-coupled devices, Phase shifts, RGB color model

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Proceedings Article | 4 March 2015 Paper

Two-wavelength microscopic speckle interferometry using colour CCD camera

Paul Upputuri, Manojit Pramanik, Mahendra Kothiyal, Krishna Nandigana

Proc. SPIE. 9302, International Conference on Experimental Mechanics 2014

KEYWORDS: Ferroelectric materials, Speckle, Interferometry, Nondestructive evaluation, CCD cameras, Data acquisition, Speckle pattern, Speckle interferometry, Charge-coupled devices, Phase shifts

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SPIE Journal Paper | 3 November 2014

Use of two wavelengths in microscopic TV holography for nondestructive testing

Paul Kumar Upputuri, Somasundaram Umapathy, Manojit Pramanik, Mahendra Prasad Kothiyal, Krishna Mohan Nandigana

OE Vol. 53 Issue 11

KEYWORDS: Nondestructive evaluation, Microscopic TV holography, CCD cameras, Charge-coupled devices, Cameras, Holography, Data acquisition, Speckle, Phase measurement, Collimation

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Proceedings Article | 10 September 2009 Paper

Microscopic TV sherography for microsystems characterization

U. Kumar, N. Mohan, M. Kothiyal

Proc. SPIE. 7432, Optical Inspection and Metrology for Non-Optics Industries

KEYWORDS: Mirrors, Fringe analysis, Digital signal processing, Microsystems, Digital photography, Speckle, Interferometers, Digital filtering, Photography, Phase shifts

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SPIE Journal Paper | 1 July 2009

Measurement of discontinuous surfaces using multiple-wavelength interferometry

Paul Kumar Upputuri, Nandigana Mohan, Mahendra Kothiyal

OE Vol. 48 Issue 07

KEYWORDS: Interferometry, Phase shifts, Phase interferometry, Silicon, Optical engineering, Charge-coupled devices, Phase measurement, Optical interferometry, Ferroelectric materials, Phase shifting

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SPIE Journal Paper | 1 February 2009

Deformation and shape measurement using multiple wavelength microscopic TV holography

U. Paul Kumar, Nandigana Krishna Mohan, Mahendra Kothiyal, Anand Asundi

OE Vol. 48 Issue 02

KEYWORDS: Microscopic TV holography, Holography, Line scan image sensors, Phase shifts, Shape analysis, Fringe analysis, Microelectromechanical systems, Ferroelectric materials, Speckle, Optical engineering

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Proceedings Article | 3 October 2008 Paper

Deformation analysis on micro objects using multiple wavelength microscopic TV holography

U. Paul Kumar, N. Krishna Mohan, M. Kothiyal, A. Asundi

Proc. SPIE. 7155, Ninth International Symposium on Laser Metrology

KEYWORDS: Microelectromechanical systems, Mirrors, Fringe analysis, Holography, Ferroelectric materials, Imaging systems, Speckle, Sensors, Phase shifts, Microscopic TV holography

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Proceedings Article | 11 August 2008 Paper

Multiple wavelength interferometry for surface profiling

U. Paul Kumar, N. Krishna Mohan, M. Kothiyal

Proc. SPIE. 7063, Interferometry XIV: Techniques and Analysis

KEYWORDS: Phase shifting, Ferroelectric materials, Silicon, Interferometry, Phase interferometry, CCD cameras, Profiling, Optical interferometry, Bismuth, Phase shifts

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Proceedings Article | 14 September 2007 Paper

Non-destructive evaluation (NDE) using multi-aperture DSPI system and fast Fourier transform method

Basanta Bhaduri, N. Krishna Mohan, M. Kothiyal

Proc. SPIE. 6671, Optical Manufacturing and Testing VII

KEYWORDS: Diffraction, Mirrors, Phase shifting, Imaging systems, Speckle, Fourier transforms, Interferometry, Nondestructive evaluation, Speckle pattern, Charge-coupled devices

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SPIE Journal Paper | 1 May 2007

(1,N) spatial phase-shifting technique in digital speckle pattern interferometry and digital shearography for nondestructive evaluation

Basanta Bhaduri, Nandigana Krishna Mohan, Mahendra Kothiyal

OE Vol. 46 Issue 05

KEYWORDS: Nondestructive evaluation, Phase shifts, Speckle, Mirrors, Polymethylmethacrylate, Speckle pattern, Surface plasmons, Charge-coupled devices, Interferometry, Shearography

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SPIE Journal Paper | 1 October 2006

Cyclic-path digital speckle shear pattern interferometer: use of polarization phase-shifting method

Basanta Bhaduri, Nandigana Krishna Mohan, Mahendra Kothiyal

OE Vol. 45 Issue 10

KEYWORDS: Speckle, Interferometers, Polarization, Phase shifts, Speckle pattern, Fringe analysis, Optical engineering, Phase shifting, Polarizers, Mirrors

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Proceedings Article | 14 August 2006 Paper

Vibration mode shape visualization with dual function DSPI system

Basanta Bhaduri, M. Kothiyal, N. Krishna Mohan

Proc. SPIE. 6292, Interferometry XIII: Techniques and Analysis

KEYWORDS: Mirrors, Fringe analysis, Ferroelectric materials, Visualization, Interferometry, Speckle pattern, Aluminum, Charge-coupled devices, Shearography, Phase shifts

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Proceedings Article | 7 March 2006 Paper

Fringe formation in a dual-beam symmetric illumination-observation TV holography system: an analysis

Nandigana Krishna Mohan, Angelica Andersson, Mikael Sjoedahl, Nils-Erik Molin

Proc. SPIE. 4101, Laser Interferometry X: Techniques and Analysis

KEYWORDS: Fringe analysis, Holography, Speckle, Interferometers, Image processing, CCD cameras, Collimation, Specular reflections, 3D image processing, Phase shifts

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Proceedings Article | 21 September 2005 Paper

A real time phase reversal read-out system with BaTiO3 crystal as a recording medium for speckle fringe analysis

Nandigana Krishna Mohan

Proc. SPIE. 5912, Operational Characteristics and Crystal Growth of Nonlinear Optical Materials II

KEYWORDS: Fringe analysis, Phase shifting, Speckle, Calibration, Quartz, Crystals, Photography, Speckle pattern, Laser crystals, Phase shifts

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Proceedings Article | 30 July 2002 Paper

Optical image processing using phase reversal Twyman-Green interferometer

Vuyyuru Venkateswara Rao, Nandigana Krishna Mohan

Proc. SPIE. 4736, Visual Information Processing XI

KEYWORDS: Mirrors, Beam splitters, Transparency, Interferometers, Calibration, Quartz, Image processing, Interferometry, Phase interferometry, Phase shifts

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SPIE Journal Paper | 1 December 2001

Dual-beam symmetric illumination-observation TV holography system for measurements

Nandigana Krishna Mohan, Angelica Svanbro, Mikael Sjodahl, Nils-Erik Molin

OE Vol. 40 Issue 12

KEYWORDS: Holography, CCD cameras, Interferometers, Sensors, Imaging systems, Illumination engineering, Image processing, Collimation, Specular reflections, Optical engineering

Proceedings Article | 4 October 2001 Paper

Development of a phase (contrast) reversal speckle interferometric system for in-plane displacement measurement with two-fold sensitivity

Nandigana Krishna Mohan

Proc. SPIE. 4564, Optomechatronic Systems II

KEYWORDS: Beam splitters, Ferroelectric materials, Speckle, Calibration, Quartz, Crystals, Photography, Interferometry, Laser crystals, Phase shifts

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SPIE Journal Paper | 1 February 2000

Parametric study of photorefractive beam coupling in BaTiO3 at multiple wavelengths

Mohammad Majles Ara, C. Vijayan, Nandigana Krishna Mohan, Rajpal Sirohi

OE Vol. 39 Issue 02

KEYWORDS: Crystals, Laser crystals, Absorption, Spatial frequencies, Refractive index, Semiconductor lasers, Image processing, Crystallography, Electro optical modeling, Iron

SPIE Journal Paper | 1 November 1999

Measurement of in-plane displacement with twofold sensitivity using phase reversal technique

Nandigana Krishna Mohan

OE Vol. 38 Issue 11

KEYWORDS: Wavefronts, Sensors, Wavefront sensors, Reconstruction algorithms, Image sensors, Phase retrieval, Phase shifts, System on a chip, Americium, Adaptive optics

Proceedings Article | 13 October 1999 Paper

Real-time image subtraction using phase reversal technique

Vuyyuru Venkateswara Rao, Nandigana Krishna Mohan

Proc. SPIE. 3783, Optical Diagnostics for Fluids/Heat/Combustion and Photomechanics for Solids

KEYWORDS: Transparency, Mach-Zehnder interferometers, Visualization, Interferometers, Calibration, Quartz, Image processing, Interferometry, Data processing, Phase shifts

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Proceedings Article | 20 September 1999 Paper

Real-time speckle shear photography using BaTiO3 for in-plane strain and displacement measurements at multiple wavelengths

Mohammad Majles Ara, C. Vijayan, Nandigana Krishna Mohan, Rajpal Sirohi

Proc. SPIE. 3801, Photorefractive Fiber and Crystal Devices: Materials, Optical Properties, and Applications V

KEYWORDS: Moire patterns, Fringe analysis, Ferroelectric materials, Speckle, Image processing, Crystals, Photography, Nd:YAG lasers, Speckle pattern, Laser crystals

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Proceedings Article | 29 April 1999 Paper

Experimental characterization of photorefractive beam coupling in BaTiO3 crystal at multiple wavelengths

Mohammad Majles Ara, C. Vijayan, Nandigana Krishna Mohan, Mahendra Kothiyal, Rajpal Sirohi

Proc. SPIE. 3729, Selected Papers from International Conference on Optics and Optoelectronics '98

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Proceedings Article | 5 November 1998 Paper

Amplification of photon echo signals for photon-echo-based optical storage and optical processing devices

Mingzhen Tian, Nandigana Krishna Mohan, Ulf Elman, Baozhu Luo, Stefan Kroell

Proc. SPIE. 3468, Advanced Optical Memories and Interfaces to Computer Storage

KEYWORDS: Optical fibers, Fiber amplifiers, Optical signal processing, Luminescence, Crystals, Photonic crystals, Signal processing, Signal generators, Optical storage, ZBLAN

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SPIE Journal Paper | 1 November 1998

Phase step calibration and phase measurement in image plane holography using BaTiO3 crystal as a recording medium

S. Suja Helen, Mohammad Majles Ara, J. Darlin, Nandigana Krishna Mohan, Mahendra Kothiyal, Rajpal Sirohi

OE Vol. 37 Issue 11

KEYWORDS: Crystals, Calibration, Fringe analysis, Phase measurement, Phase shifts, Laser crystals, Holography, Ferroelectric materials, Visualization, Diffraction gratings

Proceedings Article | 19 July 1996 Paper

Recent applications of TV holography and shearography

Nandigana Krishna Mohan, Henrik Saldner, Nils-Erik Molin

Proc. SPIE. 2861, Laser Interferometry VIII: Applications

KEYWORDS: Mirrors, Holography, Sensors, Video, Interferometry, Multiplexing, CCD cameras, Modal analysis, Charge-coupled devices, Shearography

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Proceedings Article | 19 July 1996 Paper

New simple ESPI configurations for deformation studies on large structures based on diffused reference beam

T. Santhanakrishnan, Nandigana Krishna Mohan, Rajpal Sirohi

Proc. SPIE. 2861, Laser Interferometry VIII: Applications

KEYWORDS: Mirrors, Holography, Interferometers, Cameras, Image processing, Video, Interferometry, CCD cameras, Speckle pattern, Diffusers

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Proceedings Article | 17 July 1996 Paper

Desensitized TV holography applied to static and vibrating objects for large deformation measurements

Henrik Saldner, Nils-Erik Molin, Nandigana Krishna Mohan

Proc. SPIE. 2860, Laser Interferometry VIII: Techniques and Analysis

KEYWORDS: Mirrors, Beam splitters, Holography, Modulation, Image processing, Interferometry, Phase shift keying, Vibrometry, Aluminum, Structural engineering

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SPIE Journal Paper | 1 February 1995

Comparative TV holography for vibration analysis

Henrik Saldner, Nandigana Krishna Mohan, Nils-Erik Molin

OE Vol. 34 Issue 02

KEYWORDS: Mirrors, Interferometry, Image processing, Sensors, Holography, Vibrometry, Fringe analysis, Modulation, Data processing, Phase shifts

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Proceedings Article | 12 December 1994 Paper

Deformation studies with BaTiO3 Crystal as a recording medium

P. Sreedhar, Nandigana Krishna Mohan, Rajpal Sirohi

Proc. SPIE. 2340, Interferometry '94: New Techniques and Analysis in Optical Measurements

KEYWORDS: Fringe analysis, Holography, Ferroelectric materials, Speckle, Crystals, Photography, Interferometry, Collimation, Laser crystals, Crystallography

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SPIE Journal Paper | 1 June 1994

Separation of the influence of in-plane displacement in multiaperture speckle shear interferometry

Nandigana Krishna Mohan, Prafulla Masalkar, Vadakke Murukeshan, Rajpal Sirohi

OE Vol. 33 Issue 06

KEYWORDS: Speckle, Fringe analysis, Interferometry, Diffraction, Interferometers, Imaging systems, Photography, Moire patterns, Speckle pattern, Collimation

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SPIE Journal Paper | 1 June 1994

Real-time speckle photography with two-wave mixing in photorefractive BaTi03 crystals

P. Sreedhar, Nandigana Krishna Mohan, Rajpal Sirohi

OE Vol. 33 Issue 06

KEYWORDS: Crystals, Speckle, Photography, Laser crystals, Ferroelectric materials, Fringe analysis, Phase shifts, Optical filters, Modulation, Sensors

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Proceedings Article | 28 May 1993 Paper

Electronic speckle pattern interferometry with holo-optical element

Nandigana Krishna Mohan, Prafulla Masalkar, Rajpal Sirohi

Proc. SPIE. 1821, Industrial Applications of Optical Inspection, Metrology, and Sensing

KEYWORDS: Interferometry, Speckle pattern

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Showing 5 of 33 publications

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